Kolomzarov, Y., Oleksenko, P., Sorokin, V., Tytarenko, P., & Zelinskyy, R. (2006). Disappearance of aligning properties of deposited SiOx films as caused by external factors. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Kolomzarov, Yu, P. Oleksenko, V. Sorokin, P. Tytarenko, und R. Zelinskyy. "Disappearance of Aligning Properties of Deposited SiOx Films as Caused by External Factors." Semiconductor Physics Quantum Electronics & Optoelectronics 2006.
MLA-Zitierstil (8. Ausg.)Kolomzarov, Yu, et al. "Disappearance of Aligning Properties of Deposited SiOx Films as Caused by External Factors." Semiconductor Physics Quantum Electronics & Optoelectronics, 2006.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.