APA (7th ed.) Citation

Kolomzarov, Y., Oleksenko, P., Sorokin, V., Tytarenko, P., & Zelinskyy, R. (2006). Disappearance of aligning properties of deposited SiOx films as caused by external factors. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Kolomzarov, Yu, P. Oleksenko, V. Sorokin, P. Tytarenko, and R. Zelinskyy. "Disappearance of Aligning Properties of Deposited SiOx Films as Caused by External Factors." Semiconductor Physics Quantum Electronics & Optoelectronics 2006.

MLA (8th ed.) Citation

Kolomzarov, Yu, et al. "Disappearance of Aligning Properties of Deposited SiOx Films as Caused by External Factors." Semiconductor Physics Quantum Electronics & Optoelectronics, 2006.

Warning: These citations may not always be 100% accurate.