Surface microrelief obtained by composed target deposition for LC molecules alignment
Technology of SiOx:In,Sn aligning films deposited by the cathode reactive sputtering (CRS) method is presented. The influence of In, Sn alloy surface concentration in Si cathode target on aligning film properties are investigated by the AFM and optical profilometry methods. The properties of alignin...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2006 |
| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2006
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/121643 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Surface microrelief obtained by composed target deposition for LC molecules alignment / Yu. Kolomzarov, P. Oleksenko, V. Sorokin, P. Tytarenko, R. Zelinskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 4. — С. 58-62. — Бібліогр.: 12 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862685481178759168 |
|---|---|
| author | Kolomzarov, Yu. Oleksenko, P. Sorokin, V. Tytarenko, P. Zelinskyy, R. |
| author_facet | Kolomzarov, Yu. Oleksenko, P. Sorokin, V. Tytarenko, P. Zelinskyy, R. |
| citation_txt | Surface microrelief obtained by composed target deposition for LC molecules alignment / Yu. Kolomzarov, P. Oleksenko, V. Sorokin, P. Tytarenko, R. Zelinskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 4. — С. 58-62. — Бібліогр.: 12 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | Technology of SiOx:In,Sn aligning films deposited by the cathode reactive sputtering (CRS) method is presented. The influence of In, Sn alloy surface concentration in Si cathode target on aligning film properties are investigated by the AFM and optical profilometry methods. The properties of aligning microrelief obtained by CRS method for various In, Sn concentration and by the polyimide rubbing method are compared. It was shown that such aligning microrelief can create defectless and perfect at the microscopic level nematic LC oriented structures.
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| first_indexed | 2025-12-07T16:00:29Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-121643 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T16:00:29Z |
| publishDate | 2006 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Kolomzarov, Yu. Oleksenko, P. Sorokin, V. Tytarenko, P. Zelinskyy, R. 2017-06-15T03:48:54Z 2017-06-15T03:48:54Z 2006 Surface microrelief obtained by composed target deposition for LC molecules alignment / Yu. Kolomzarov, P. Oleksenko, V. Sorokin, P. Tytarenko, R. Zelinskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 4. — С. 58-62. — Бібліогр.: 12 назв. — англ. 1560-8034 PACS 42.79.Kr https://nasplib.isofts.kiev.ua/handle/123456789/121643 Technology of SiOx:In,Sn aligning films deposited by the cathode reactive sputtering (CRS) method is presented. The influence of In, Sn alloy surface concentration in Si cathode target on aligning film properties are investigated by the AFM and optical profilometry methods. The properties of aligning microrelief obtained by CRS method for various In, Sn concentration and by the polyimide rubbing method are compared. It was shown that such aligning microrelief can create defectless and perfect at the microscopic level nematic LC oriented structures. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Surface microrelief obtained by composed target deposition for LC molecules alignment Article published earlier |
| spellingShingle | Surface microrelief obtained by composed target deposition for LC molecules alignment Kolomzarov, Yu. Oleksenko, P. Sorokin, V. Tytarenko, P. Zelinskyy, R. |
| title | Surface microrelief obtained by composed target deposition for LC molecules alignment |
| title_full | Surface microrelief obtained by composed target deposition for LC molecules alignment |
| title_fullStr | Surface microrelief obtained by composed target deposition for LC molecules alignment |
| title_full_unstemmed | Surface microrelief obtained by composed target deposition for LC molecules alignment |
| title_short | Surface microrelief obtained by composed target deposition for LC molecules alignment |
| title_sort | surface microrelief obtained by composed target deposition for lc molecules alignment |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/121643 |
| work_keys_str_mv | AT kolomzarovyu surfacemicroreliefobtainedbycomposedtargetdepositionforlcmoleculesalignment AT oleksenkop surfacemicroreliefobtainedbycomposedtargetdepositionforlcmoleculesalignment AT sorokinv surfacemicroreliefobtainedbycomposedtargetdepositionforlcmoleculesalignment AT tytarenkop surfacemicroreliefobtainedbycomposedtargetdepositionforlcmoleculesalignment AT zelinskyyr surfacemicroreliefobtainedbycomposedtargetdepositionforlcmoleculesalignment |