Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy

The interface of ZERODUR ceramics and thin aluminium film was investigated by Raman and secondary ion mass-spectroscopy techniques. Possible chemical reactions at the interface is briefly analyzed and compared with experimental data. Contributions of amorphous and crystalline phases of ZERODUR to Ra...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2005
Hauptverfasser: Berezhinsky, L.I., Yukhymchuk, V.A., Maslov, V.P., Tetyorkin, V.V.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2005
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/121644
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy / L.I. Berezhinsky, V.P. Maslov V.V. Tetyorkin and V.A.Yukhymchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 37-40. — Бібліогр.: 5 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121644
record_format dspace
spelling Berezhinsky, L.I.
Yukhymchuk, V.A.
Maslov, V.P.
Tetyorkin, V.V.
2017-06-15T03:49:52Z
2017-06-15T03:49:52Z
2005
Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy / L.I. Berezhinsky, V.P. Maslov V.V. Tetyorkin and V.A.Yukhymchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 37-40. — Бібліогр.: 5 назв. — англ.
1560-8034
PACS: 78.30.L
https://nasplib.isofts.kiev.ua/handle/123456789/121644
The interface of ZERODUR ceramics and thin aluminium film was investigated by Raman and secondary ion mass-spectroscopy techniques. Possible chemical reactions at the interface is briefly analyzed and compared with experimental data. Contributions of amorphous and crystalline phases of ZERODUR to Raman spectra are discussed. Keywords: ZERODUR ceramics, Raman spectra, secondary ion mass-spectroscopy. Manuscript received 19.04.05; accepted for publication 18.05.05.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy
spellingShingle Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy
Berezhinsky, L.I.
Yukhymchuk, V.A.
Maslov, V.P.
Tetyorkin, V.V.
title_short Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy
title_full Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy
title_fullStr Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy
title_full_unstemmed Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy
title_sort investigation of al-zerodur interface by raman and secondary ion mass spectroscopy
author Berezhinsky, L.I.
Yukhymchuk, V.A.
Maslov, V.P.
Tetyorkin, V.V.
author_facet Berezhinsky, L.I.
Yukhymchuk, V.A.
Maslov, V.P.
Tetyorkin, V.V.
publishDate 2005
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The interface of ZERODUR ceramics and thin aluminium film was investigated by Raman and secondary ion mass-spectroscopy techniques. Possible chemical reactions at the interface is briefly analyzed and compared with experimental data. Contributions of amorphous and crystalline phases of ZERODUR to Raman spectra are discussed. Keywords: ZERODUR ceramics, Raman spectra, secondary ion mass-spectroscopy. Manuscript received 19.04.05; accepted for publication 18.05.05.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/121644
citation_txt Investigation of Al-ZERODUR interface by Raman and secondary ion mass spectroscopy / L.I. Berezhinsky, V.P. Maslov V.V. Tetyorkin and V.A.Yukhymchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 37-40. — Бібліогр.: 5 назв. — англ.
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