Method for replacing objects in 4F correlator: testing

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2005
• ISSN: 1560-8034
• Hauptverfasser: Yezhov, P.V., Kuzmenko, A.V., Smirnova, Т.N., Ivanovskyy, A. A.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2005
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/121649
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Method for replacing objects in 4F correlator: testing / P.V. Yezhov, A.V. Kuzmenko, Т.N. Smirnova, A. A. Ivanovskyy // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 2. — С. 75-80. — Бібліогр.: 13 назв. — англ.

The method of pattern recognition based on replacement of object images incoming to the correlator by object-dependent synthesized phase objects calculated using the iterative Fourier-transform algorithm was developed by us earlier. In this work, we performed experimental testing the above method by...