APA (7th ed.) Citation

Ponomaryov, S., Yukhymchuk, V., & Valakh, M. (2016). Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Ponomaryov, S.S, V.O Yukhymchuk, and M.Ya Valakh. "Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics 2016.

MLA (8th ed.) Citation

Ponomaryov, S.S, et al. "Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics, 2016.

Warning: These citations may not always be 100% accurate.