Ponomaryov, S., Yukhymchuk, V., & Valakh, M. (2016). Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Ponomaryov, S.S, V.O Yukhymchuk, та M.Ya Valakh. "Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics 2016.
Стиль цитування MLA (8-ме видання)Ponomaryov, S.S, et al. "Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics, 2016.