Ponomaryov, S., Yukhymchuk, V., & Valakh, M. (2016). Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Ponomaryov, S.S, V.O Yukhymchuk, und M.Ya Valakh. "Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics 2016.
MLA-Zitierstil (8. Ausg.)Ponomaryov, S.S, et al. "Drift Correction of the Analyzed Area During the Study of the Lateral Elemental Composition Distribution in Single Semiconductor Nanostructures by Scanning Auger Microscopy." Semiconductor Physics Quantum Electronics & Optoelectronics, 2016.