Thermally stimulated exoelectron emission from solid Xe

Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy
 electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated
 exoelectron emission (TSEE) to sample prehistory was demonstrated. It...

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Опубліковано в: :Физика низких температур
Дата:2007
Автори: Khyzhniy, I.V., Grigorashchenko, O.N., Ponomaryov, A.N., Savchenko, E.V., Bondybey, V.E.
Формат: Стаття
Мова:Англійська
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2007
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Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/121792
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
author_facet Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
citation_txt Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос.
collection DSpace DC
container_title Физика низких температур
description Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy
 electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated
 exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps
 in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed
 samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL
 and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained
 suggest a competition between two relaxation channels: charge recombination and electron transport terminated
 by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures
 TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated
 solid Xe, was revealed.
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language English
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publishDate 2007
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
record_format dspace
spelling Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
2017-06-16T08:03:17Z
2017-06-16T08:03:17Z
2007
Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос.
0132-6414
PACS: 78.60.Kn; 79.75.+g
https://nasplib.isofts.kiev.ua/handle/123456789/121792
Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy
 electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated
 exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps
 in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed
 samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL
 and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained
 suggest a competition between two relaxation channels: charge recombination and electron transport terminated
 by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures
 TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated
 solid Xe, was revealed.
en
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
Electronic Processes in Cryocrystals
Thermally stimulated exoelectron emission from solid Xe
Article
published earlier
spellingShingle Thermally stimulated exoelectron emission from solid Xe
Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
Electronic Processes in Cryocrystals
title Thermally stimulated exoelectron emission from solid Xe
title_full Thermally stimulated exoelectron emission from solid Xe
title_fullStr Thermally stimulated exoelectron emission from solid Xe
title_full_unstemmed Thermally stimulated exoelectron emission from solid Xe
title_short Thermally stimulated exoelectron emission from solid Xe
title_sort thermally stimulated exoelectron emission from solid xe
topic Electronic Processes in Cryocrystals
topic_facet Electronic Processes in Cryocrystals
url https://nasplib.isofts.kiev.ua/handle/123456789/121792
work_keys_str_mv AT khyzhniyiv thermallystimulatedexoelectronemissionfromsolidxe
AT grigorashchenkoon thermallystimulatedexoelectronemissionfromsolidxe
AT ponomaryovan thermallystimulatedexoelectronemissionfromsolidxe
AT savchenkoev thermallystimulatedexoelectronemissionfromsolidxe
AT bondybeyve thermallystimulatedexoelectronemissionfromsolidxe