Thermally stimulated exoelectron emission from solid Xe
Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that e...
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| Published in: | Физика низких температур |
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| Date: | 2007 |
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| Format: | Article |
| Language: | English |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2007
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/121792 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-121792 |
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Khyzhniy, I.V. Grigorashchenko, O.N. Ponomaryov, A.N. Savchenko, E.V. Bondybey, V.E. 2017-06-16T08:03:17Z 2017-06-16T08:03:17Z 2007 Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос. 0132-6414 PACS: 78.60.Kn; 79.75.+g https://nasplib.isofts.kiev.ua/handle/123456789/121792 Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained suggest a competition between two relaxation channels: charge recombination and electron transport terminated by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated solid Xe, was revealed. en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур Electronic Processes in Cryocrystals Thermally stimulated exoelectron emission from solid Xe Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Thermally stimulated exoelectron emission from solid Xe |
| spellingShingle |
Thermally stimulated exoelectron emission from solid Xe Khyzhniy, I.V. Grigorashchenko, O.N. Ponomaryov, A.N. Savchenko, E.V. Bondybey, V.E. Electronic Processes in Cryocrystals |
| title_short |
Thermally stimulated exoelectron emission from solid Xe |
| title_full |
Thermally stimulated exoelectron emission from solid Xe |
| title_fullStr |
Thermally stimulated exoelectron emission from solid Xe |
| title_full_unstemmed |
Thermally stimulated exoelectron emission from solid Xe |
| title_sort |
thermally stimulated exoelectron emission from solid xe |
| author |
Khyzhniy, I.V. Grigorashchenko, O.N. Ponomaryov, A.N. Savchenko, E.V. Bondybey, V.E. |
| author_facet |
Khyzhniy, I.V. Grigorashchenko, O.N. Ponomaryov, A.N. Savchenko, E.V. Bondybey, V.E. |
| topic |
Electronic Processes in Cryocrystals |
| topic_facet |
Electronic Processes in Cryocrystals |
| publishDate |
2007 |
| language |
English |
| container_title |
Физика низких температур |
| publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| format |
Article |
| description |
Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy
electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated
exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps
in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed
samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL
and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained
suggest a competition between two relaxation channels: charge recombination and electron transport terminated
by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures
TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated
solid Xe, was revealed.
|
| issn |
0132-6414 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/121792 |
| citation_txt |
Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос. |
| work_keys_str_mv |
AT khyzhniyiv thermallystimulatedexoelectronemissionfromsolidxe AT grigorashchenkoon thermallystimulatedexoelectronemissionfromsolidxe AT ponomaryovan thermallystimulatedexoelectronemissionfromsolidxe AT savchenkoev thermallystimulatedexoelectronemissionfromsolidxe AT bondybeyve thermallystimulatedexoelectronemissionfromsolidxe |
| first_indexed |
2025-12-07T20:27:54Z |
| last_indexed |
2025-12-07T20:27:54Z |
| _version_ |
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