Thermally stimulated exoelectron emission from solid Xe

Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that e...

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Published in:Физика низких температур
Date:2007
Main Authors: Khyzhniy, I.V., Grigorashchenko, O.N., Ponomaryov, A.N., Savchenko, E.V., Bondybey, V.E.
Format: Article
Language:English
Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2007
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/121792
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121792
record_format dspace
spelling Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
2017-06-16T08:03:17Z
2017-06-16T08:03:17Z
2007
Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос.
0132-6414
PACS: 78.60.Kn; 79.75.+g
https://nasplib.isofts.kiev.ua/handle/123456789/121792
Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained suggest a competition between two relaxation channels: charge recombination and electron transport terminated by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated solid Xe, was revealed.
en
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
Electronic Processes in Cryocrystals
Thermally stimulated exoelectron emission from solid Xe
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Thermally stimulated exoelectron emission from solid Xe
spellingShingle Thermally stimulated exoelectron emission from solid Xe
Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
Electronic Processes in Cryocrystals
title_short Thermally stimulated exoelectron emission from solid Xe
title_full Thermally stimulated exoelectron emission from solid Xe
title_fullStr Thermally stimulated exoelectron emission from solid Xe
title_full_unstemmed Thermally stimulated exoelectron emission from solid Xe
title_sort thermally stimulated exoelectron emission from solid xe
author Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
author_facet Khyzhniy, I.V.
Grigorashchenko, O.N.
Ponomaryov, A.N.
Savchenko, E.V.
Bondybey, V.E.
topic Electronic Processes in Cryocrystals
topic_facet Electronic Processes in Cryocrystals
publishDate 2007
language English
container_title Физика низких температур
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
format Article
description Thermally-stimulated emission of exoelectrons and photons from solid Xe pre-irradiated by low-energy electrons were studied. A high sensitivity of thermally-stimulated luminescence (TSL) and thermally-stimulated exoelectron emission (TSEE) to sample prehistory was demonstrated. It was shown that electron traps in unannealed samples are characterized by a much broader distribution of trap levels in comparison with annealed samples and their concentration exceeds in number that in annealed samples. Both phenomena, TSL and TSEE, were found to be triggered by release of electrons from the same kind of traps. The data obtained suggest a competition between two relaxation channels: charge recombination and electron transport terminated by TSL and TSEE. It was found that TSEE predominates at low temperatures while at higher temperatures TSL prevails. An additional relaxation channel, a photon-stimulated exoelectron emission from pre-irradiated solid Xe, was revealed.
issn 0132-6414
url https://nasplib.isofts.kiev.ua/handle/123456789/121792
citation_txt Thermally stimulated exoelectron emission from solid Xe / I.V. Khyzhniy, O.N. Grigorashchenko, A.N. Ponomaryov, E.V. Savchenko, V.E. Bondybey // Физика низких температур. — 2007. — Т. 33, № 6-7. — С. 701-704. — Бібліогр.: 11 назв. — рос.
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AT grigorashchenkoon thermallystimulatedexoelectronemissionfromsolidxe
AT ponomaryovan thermallystimulatedexoelectronemissionfromsolidxe
AT savchenkoev thermallystimulatedexoelectronemissionfromsolidxe
AT bondybeyve thermallystimulatedexoelectronemissionfromsolidxe
first_indexed 2025-12-07T20:27:54Z
last_indexed 2025-12-07T20:27:54Z
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