Radiation-stimulated processes in silicon structures with contacts based on TiN

The influence of irradiation on the structural properties of titanium nitride films deposited on silicon wafers has been considered. It has been shown that depending on the energy, fluence and type of irradiation ion, observed are the increase of accumulated damages with decreasing the grain size, t...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2015
Main Authors: Nasyrov, M.U., Ataubaeva, A.B.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2015
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/121819
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Radiation-stimulated processes in silicon structureswith contacts based on TiN / M.U. Nasyrov, A.B. Ataubaeva // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 2. — С. 220-225. — Бібліогр.: 25 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Nasyrov, M.U.
Ataubaeva, A.B.
author_facet Nasyrov, M.U.
Ataubaeva, A.B.
citation_txt Radiation-stimulated processes in silicon structureswith contacts based on TiN / M.U. Nasyrov, A.B. Ataubaeva // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 2. — С. 220-225. — Бібліогр.: 25 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description The influence of irradiation on the structural properties of titanium nitride films deposited on silicon wafers has been considered. It has been shown that depending on the energy, fluence and type of irradiation ion, observed are the increase of accumulated damages with decreasing the grain size, the grain size reduction with increasing the fluence, the increase of dislocation density and microstrains.
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-11-30T11:06:10Z
publishDate 2015
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Nasyrov, M.U.
Ataubaeva, A.B.
2017-06-18T10:43:17Z
2017-06-18T10:43:17Z
2015
Radiation-stimulated processes in silicon structureswith contacts based on TiN / M.U. Nasyrov, A.B. Ataubaeva // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 2. — С. 220-225. — Бібліогр.: 25 назв. — англ.
1560-8034
DOI: 10.15407/spqeo18.02.220
PACS 61.80.-x
https://nasplib.isofts.kiev.ua/handle/123456789/121819
The influence of irradiation on the structural properties of titanium nitride films deposited on silicon wafers has been considered. It has been shown that depending on the energy, fluence and type of irradiation ion, observed are the increase of accumulated damages with decreasing the grain size, the grain size reduction with increasing the fluence, the increase of dislocation density and microstrains.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Radiation-stimulated processes in silicon structures with contacts based on TiN
Article
published earlier
spellingShingle Radiation-stimulated processes in silicon structures with contacts based on TiN
Nasyrov, M.U.
Ataubaeva, A.B.
title Radiation-stimulated processes in silicon structures with contacts based on TiN
title_full Radiation-stimulated processes in silicon structures with contacts based on TiN
title_fullStr Radiation-stimulated processes in silicon structures with contacts based on TiN
title_full_unstemmed Radiation-stimulated processes in silicon structures with contacts based on TiN
title_short Radiation-stimulated processes in silicon structures with contacts based on TiN
title_sort radiation-stimulated processes in silicon structures with contacts based on tin
url https://nasplib.isofts.kiev.ua/handle/123456789/121819
work_keys_str_mv AT nasyrovmu radiationstimulatedprocessesinsiliconstructureswithcontactsbasedontin
AT ataubaevaab radiationstimulatedprocessesinsiliconstructureswithcontactsbasedontin