APA (7th ed.) Citation

Skobtsov, V., & Rakhman, A. T. A. (2012). The test generation of digital sequential circuits with the multiple observation time strategy. Труды Института прикладной математики и механики.

Chicago Style (17th ed.) Citation

Skobtsov, V.Y, and Al Tal Abdel Rakhman. "The Test Generation of Digital Sequential Circuits with the Multiple Observation Time Strategy." Труды Института прикладной математики и механики 2012.

MLA (8th ed.) Citation

Skobtsov, V.Y, and Al Tal Abdel Rakhman. "The Test Generation of Digital Sequential Circuits with the Multiple Observation Time Strategy." Труды Института прикладной математики и механики, 2012.

Warning: These citations may not always be 100% accurate.