The test generation of digital sequential circuits with the multiple observation time strategy

• Published in: Труды Института прикладной математики и механики
• Date: 2012
• Main Authors: Skobtsov, V.Y., Rakhman, Al Tal Abdel
• Format: Article
• Language: English
• Published: Інститут прикладної математики і механіки НАН України 2012
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/124131
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: The test generation of digital sequential circuits with the multiple observation time strategy / V.Y. Skobtsov, Al Tal Abdel Rakhman // Труды Института прикладной математики и механики НАН Украины. — Донецьк: ІПММ НАН України, 2012. — Т. 25. — С. 210-216. — Бібліогр.: 3 назв. — англ.

The test generation method is designed for digital circuits with memory on the basis of distinguishing state pairs of good and fault devices. The multiple observation time test strategy, 16-valued alphabet and genetic algorithms are used. The proposed method permits to cover the faults that are not...