Copper-doping effects in electronic structure and spectral properties of SmNi₅

The electronic structure and optical properties of the SmNi₅₋Cux (x = 0, 1, 2) compounds are studied. The
 band spectra of the studied intermetallics were calculated with LDA+U+SO method supplementing the local
 density approximation with a correction for strong electron interaction...

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Збережено в:
Бібліографічні деталі
Опубліковано в: :Физика низких температур
Дата:2015
Автори: Knyazev, Yu.V., Lukoyanov, A.V., Kuz’min, Yu.I., Kuchin, A.G.
Формат: Стаття
Мова:Англійська
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2015
Теми:
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/128292
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Copper-doping effects in electronic structure and spectral properties of SmNi₅ / Yu.V. Knyazev, A.V. Lukoyanov, Yu.I. Kuz’min, A.G. Kuchin // Физика низких температур. — 2015. — Т. 41, № 12. — С. 1313–1317. — Бібліогр.: 15 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
Опис
Резюме:The electronic structure and optical properties of the SmNi₅₋Cux (x = 0, 1, 2) compounds are studied. The
 band spectra of the studied intermetallics were calculated with LDA+U+SO method supplementing the local
 density approximation with a correction for strong electron interaction on the shell of the rare-earth element. Optical
 properties were studied by ellipsometry method in the wide wavelength range. It was found that the substitution
 of copper for nickel leads to local changes in the optical conductivity spectra. Both the spectroscopic
 measurements and theoretical calculations demonstrate the presence of a broad absorption band around 4 eV associated
 with the Cu 3d → Ni 3d electron transitions and increasing with the grown of copper content. The experimental
 dispersion curves of optical conductivity in the interband absorption region were interpreted using the
 results of the calculations.
ISSN:0132-6414