Low temperature electron transport on semiconductor surfaces

The low temperature electron transport on semiconductor surfaces has been studied using an ultra high vacuum, variable temperature Scanning Tunneling Microscope (STM). The STM I(V) spectroscopy recorded at various temperatures has enabled to investigate the temperature dependence (300 K to 35 K) of...

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Опубліковано в: :Физика низких температур
Дата:2003
Автори: Lastapis, M., Riedel, D., Mayne, A., Bobrov, K., Dujardin, G.
Формат: Стаття
Мова:English
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2003
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Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/128815
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Low temperature electron transport on semiconductor surfaces / M. Lastapis, D. Riedel, A. Mayne, K. Bobrov, G. Dujardin // Физика низких температур. — 2003. — Т. 29, № 3. — С. 263-269. — Бібліогр.: 9 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-128815
record_format dspace
spelling Lastapis, M.
Riedel, D.
Mayne, A.
Bobrov, K.
Dujardin, G.
2018-01-14T09:03:18Z
2018-01-14T09:03:18Z
2003
Low temperature electron transport on semiconductor surfaces / M. Lastapis, D. Riedel, A. Mayne, K. Bobrov, G. Dujardin // Физика низких температур. — 2003. — Т. 29, № 3. — С. 263-269. — Бібліогр.: 9 назв. — англ.
0132-6414
PACS: 72.20.Jv
https://nasplib.isofts.kiev.ua/handle/123456789/128815
The low temperature electron transport on semiconductor surfaces has been studied using an ultra high vacuum, variable temperature Scanning Tunneling Microscope (STM). The STM I(V) spectroscopy recorded at various temperatures has enabled to investigate the temperature dependence (300 K to 35 K) of the surface conductivity of three different semiconductor surfaces: highly doped n-type Si(100), p-type Si(100), and hydrogenated C(100). Low temperature freezing of specific surface electronic channels on the higly doped n-type Si(100) and moderately doped p-type Si(100) surfaces could be achieved whereas the total surface conductivity on the hydrogenated C(100) surface can be frozen below only 180 K.
We wish to thank the European IST-FET «Bottom-up-Nanomachines» (BUN) and the European «Atomic and Molecular Manipulation; a new tool In Science and Technology» (AMMIST) network.
en
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
Electronically Induced Phenomena: Low Temperature Aspects
Low temperature electron transport on semiconductor surfaces
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Low temperature electron transport on semiconductor surfaces
spellingShingle Low temperature electron transport on semiconductor surfaces
Lastapis, M.
Riedel, D.
Mayne, A.
Bobrov, K.
Dujardin, G.
Electronically Induced Phenomena: Low Temperature Aspects
title_short Low temperature electron transport on semiconductor surfaces
title_full Low temperature electron transport on semiconductor surfaces
title_fullStr Low temperature electron transport on semiconductor surfaces
title_full_unstemmed Low temperature electron transport on semiconductor surfaces
title_sort low temperature electron transport on semiconductor surfaces
author Lastapis, M.
Riedel, D.
Mayne, A.
Bobrov, K.
Dujardin, G.
author_facet Lastapis, M.
Riedel, D.
Mayne, A.
Bobrov, K.
Dujardin, G.
topic Electronically Induced Phenomena: Low Temperature Aspects
topic_facet Electronically Induced Phenomena: Low Temperature Aspects
publishDate 2003
language English
container_title Физика низких температур
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
format Article
description The low temperature electron transport on semiconductor surfaces has been studied using an ultra high vacuum, variable temperature Scanning Tunneling Microscope (STM). The STM I(V) spectroscopy recorded at various temperatures has enabled to investigate the temperature dependence (300 K to 35 K) of the surface conductivity of three different semiconductor surfaces: highly doped n-type Si(100), p-type Si(100), and hydrogenated C(100). Low temperature freezing of specific surface electronic channels on the higly doped n-type Si(100) and moderately doped p-type Si(100) surfaces could be achieved whereas the total surface conductivity on the hydrogenated C(100) surface can be frozen below only 180 K.
issn 0132-6414
url https://nasplib.isofts.kiev.ua/handle/123456789/128815
citation_txt Low temperature electron transport on semiconductor surfaces / M. Lastapis, D. Riedel, A. Mayne, K. Bobrov, G. Dujardin // Физика низких температур. — 2003. — Т. 29, № 3. — С. 263-269. — Бібліогр.: 9 назв. — англ.
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AT riedeld lowtemperatureelectrontransportonsemiconductorsurfaces
AT maynea lowtemperatureelectrontransportonsemiconductorsurfaces
AT bobrovk lowtemperatureelectrontransportonsemiconductorsurfaces
AT dujarding lowtemperatureelectrontransportonsemiconductorsurfaces
first_indexed 2025-11-27T23:57:22Z
last_indexed 2025-11-27T23:57:22Z
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