Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001)

Electron stimulated desorption ion angular distribution (ESDIAD) and temperature programmed desorption (TPD) techniques have been employed to study radiation-induced decomposition of fractional monolayer SF₆ films physisorbed on Ru(0001) at 25 K. Our focus is on the origin of F⁺ and F⁻ ions, which d...

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Veröffentlicht in:Физика низких температур
Datum:2003
Hauptverfasser: Faradzhev, N.S., Kusmierek, D.O., Yakshinskiy, B.V., Madey, T.E.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2003
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Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/128817
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Zitieren:Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001) / N.S. Faradzhev, D.O. Kusmierek, B.V. Yakshinskiy, T.E. Madey // Физика низких температур. — 2003. — Т. 29, № 3. — С. 286-295. — Бібліогр.: 34 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Faradzhev, N.S.
Kusmierek, D.O.
Yakshinskiy, B.V.
Madey, T.E.
author_facet Faradzhev, N.S.
Kusmierek, D.O.
Yakshinskiy, B.V.
Madey, T.E.
citation_txt Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001) / N.S. Faradzhev, D.O. Kusmierek, B.V. Yakshinskiy, T.E. Madey // Физика низких температур. — 2003. — Т. 29, № 3. — С. 286-295. — Бібліогр.: 34 назв. — англ.
collection DSpace DC
container_title Физика низких температур
description Electron stimulated desorption ion angular distribution (ESDIAD) and temperature programmed desorption (TPD) techniques have been employed to study radiation-induced decomposition of fractional monolayer SF₆ films physisorbed on Ru(0001) at 25 K. Our focus is on the origin of F⁺ and F⁻ ions, which dominate ESD from fractional monolayers. F⁻ ions escape only in off-normal directions and originate from undissociated molecules. The origins of F⁺ ions are more complicated. The F⁺ ions from electron stimulated desorption of molecularly adsorbed SF₆ desorb in off-normal directions, in symmetric ESDIAD patterns. Electron beam exposure leads to formation of SFx (x = 0 - 5) fragments, which become the source of positive ions in normal and off-normal directions. Electron exposure > 10¹⁶ cm⁻ ² results in decomposition of the entire adsorbed SF₆ layer.
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language English
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publishDate 2003
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
record_format dspace
spelling Faradzhev, N.S.
Kusmierek, D.O.
Yakshinskiy, B.V.
Madey, T.E.
2018-01-14T09:05:41Z
2018-01-14T09:05:41Z
2003
Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001) / N.S. Faradzhev, D.O. Kusmierek, B.V. Yakshinskiy, T.E. Madey // Физика низких температур. — 2003. — Т. 29, № 3. — С. 286-295. — Бібліогр.: 34 назв. — англ.
0132-6414
PACS: 79.20.La
https://nasplib.isofts.kiev.ua/handle/123456789/128817
Electron stimulated desorption ion angular distribution (ESDIAD) and temperature programmed desorption (TPD) techniques have been employed to study radiation-induced decomposition of fractional monolayer SF₆ films physisorbed on Ru(0001) at 25 K. Our focus is on the origin of F⁺ and F⁻ ions, which dominate ESD from fractional monolayers. F⁻ ions escape only in off-normal directions and originate from undissociated molecules. The origins of F⁺ ions are more complicated. The F⁺ ions from electron stimulated desorption of molecularly adsorbed SF₆ desorb in off-normal directions, in symmetric ESDIAD patterns. Electron beam exposure leads to formation of SFx (x = 0 - 5) fragments, which become the source of positive ions in normal and off-normal directions. Electron exposure > 10¹⁶ cm⁻ ² results in decomposition of the entire adsorbed SF₆ layer.
We acknowledge valuable discussions with Prof. E. Carter. This work has been supported in part by the US National Science Foundation, Grant No. CHE 0075995.
en
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
Electronically Induced Phenomena: Low Temperature Aspects
Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001)
Article
published earlier
spellingShingle Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001)
Faradzhev, N.S.
Kusmierek, D.O.
Yakshinskiy, B.V.
Madey, T.E.
Electronically Induced Phenomena: Low Temperature Aspects
title Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001)
title_full Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001)
title_fullStr Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001)
title_full_unstemmed Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001)
title_short Effects of electron irradiation on structure and bonding of SF₆ on Ru(0001)
title_sort effects of electron irradiation on structure and bonding of sf₆ on ru(0001)
topic Electronically Induced Phenomena: Low Temperature Aspects
topic_facet Electronically Induced Phenomena: Low Temperature Aspects
url https://nasplib.isofts.kiev.ua/handle/123456789/128817
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