Structural peculiarities of quench-condensed pure and argon-doped nitrous oxide
Electron diffraction studies have been carried out for condensed N₂O and N₂O–Ar films. Deposition took place at substrate temperatures of 10 and 20 K. The growth process of N₂O deposits was studied. A strong effect of argon impurities on the structure of the nitrous oxide matrix has been observed. T...
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| Veröffentlicht in: | Физика низких температур |
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| Datum: | 2003 |
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | English |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2003
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/128927 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Structural peculiarities of quench-condensed pure and argon-doped nitrous oxide / A.A. Solodovnik V.V. Danchuk // Физика низких температур. — 2003. — Т. 29, № 9-10. — С. 1041-1044. — Бібліогр.: 15 назв. — англ. |