Luminescence and formation of alkalihalide ionic excimers in solid Ne and Ar

Transitions from ionic states A²⁺X– of alkalihalides CsF, CsCl and RbF isolated in solid Ne and Ar films recorded under pulsed e-beam excitation are studied. The B(²∑₁/₂)-X(²∑₁/₂) and C(²П₃/₂)-A(²П₃/₂) luminescence bands of Cs2+F– (196.5 nm, 227 nm), Cs²⁺Cl– (220.1 nm, 249.2 nm) and Rb²⁺F– (136 nm)...

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Published in:Физика низких температур
Date:2003
Main Authors: Śliwiński, G., Frankowski, M., Schwentner, N.
Format: Article
Language:English
Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2003
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/128938
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Luminescence and formation of alkalihalide ionic excimers in solid Ne and Ar / G. Śliwiński, M. Frankowski, N. Schwentner // Физика низких температур. — 2003. — Т. 29, № 9-10. — С. 1113-1117. — Бібліогр.: 18 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Summary:Transitions from ionic states A²⁺X– of alkalihalides CsF, CsCl and RbF isolated in solid Ne and Ar films recorded under pulsed e-beam excitation are studied. The B(²∑₁/₂)-X(²∑₁/₂) and C(²П₃/₂)-A(²П₃/₂) luminescence bands of Cs2+F– (196.5 nm, 227 nm), Cs²⁺Cl– (220.1 nm, 249.2 nm) and Rb²⁺F– (136 nm) in Ne, and a weakerB–X emission of Cs²⁺F– (211.2 nm) in Ar are identified. For CsF the depopulation of the A²⁺X– state is dominated by the radiative decay. A ratio of the recorded exciplex emission intensities of I(CsF)/I(CsCl)/I(RbF) = 20/5/1 reflects the luminescence efficiency and for RbF and CsCl a competitive emission channel due to predissociation in the A²⁺X⁻(B²∑₁/₂) state is observed. For these molecules an efficient formation of the state X*₂ is confirmed through recording the molecular D`(³П₂g)-A`(³П₂u) transition. A strong dependence of the luminescence intensities on the alkalihalide content reveals quenching at concentrations higher than 0.7%.
ISSN:0132-6414