On the nature of ionic liquid gating of Nd₂CuO₄ thin films

Recently, ionic liquid gating has been used to modulate the charge carrier properties of metal oxides. The mechanism behind it, however, is still a matter of debate. In this paper, we report experiments on doped and undoped Nd₂CuO₄. We find major resistance drops of the bilayer coupled to observatio...

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Veröffentlicht in:Физика низких температур
Datum:2017
Hauptverfasser: Atesci, Hasan, Coneri, Francesco, Leeuwenhoek, Maarten, Hilgenkamp, Hans, Jan M. van Ruitenbeek
Format: Artikel
Sprache:English
Veröffentlicht: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2017
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Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/129380
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Zitieren:On the nature of ionic liquid gating of Nd₂CuO₄ thin films / Hasan Atesci, Francesco Coneri, Maarten Leeuwenhoek, Hans Hilgenkamp, Jan M. van Ruitenbeek // Физика низких температур. — 2017. — Т. 43, № 2. — С. 353-359. — Бібліогр.: 50 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-129380
record_format dspace
spelling Atesci, Hasan
Coneri, Francesco
Leeuwenhoek, Maarten
Hilgenkamp, Hans
Jan M. van Ruitenbeek
2018-01-19T14:27:02Z
2018-01-19T14:27:02Z
2017
On the nature of ionic liquid gating of Nd₂CuO₄ thin films / Hasan Atesci, Francesco Coneri, Maarten Leeuwenhoek, Hans Hilgenkamp, Jan M. van Ruitenbeek // Физика низких температур. — 2017. — Т. 43, № 2. — С. 353-359. — Бібліогр.: 50 назв. — англ.
0132-6414
PACS: 66.10.–x, 68.15.+e, 82.45.–h
https://nasplib.isofts.kiev.ua/handle/123456789/129380
Recently, ionic liquid gating has been used to modulate the charge carrier properties of metal oxides. The mechanism behind it, however, is still a matter of debate. In this paper, we report experiments on doped and undoped Nd₂CuO₄. We find major resistance drops of the bilayer coupled to observations of the presence of a considerable Faradeic component in the gate current and of the appearance of charge transfer peaks in the cyclic voltammetry data. This leads us to propose a mechanism of gating based on irreversible electrochemical reactions, likely due to trace amounts of contaminations present in the ionic liquid. This work is therefore in line with previous reports confirming the presence of irreversible electrochemistry in ionic liquid gated electron- doped cuprates.
This work is part of the research programme of the Foundation for Fundamental Research on Matter (FOM, 12PR3047), which is financially supported by the Netherlands Organization for Scientific Research (NWO). The authors also gratefully acknowledge the technical support from J. Aarts and S. Voltan.
en
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
К 100-летию со дня рождения И.М. Лифшица
On the nature of ionic liquid gating of Nd₂CuO₄ thin films
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title On the nature of ionic liquid gating of Nd₂CuO₄ thin films
spellingShingle On the nature of ionic liquid gating of Nd₂CuO₄ thin films
Atesci, Hasan
Coneri, Francesco
Leeuwenhoek, Maarten
Hilgenkamp, Hans
Jan M. van Ruitenbeek
К 100-летию со дня рождения И.М. Лифшица
title_short On the nature of ionic liquid gating of Nd₂CuO₄ thin films
title_full On the nature of ionic liquid gating of Nd₂CuO₄ thin films
title_fullStr On the nature of ionic liquid gating of Nd₂CuO₄ thin films
title_full_unstemmed On the nature of ionic liquid gating of Nd₂CuO₄ thin films
title_sort on the nature of ionic liquid gating of nd₂cuo₄ thin films
author Atesci, Hasan
Coneri, Francesco
Leeuwenhoek, Maarten
Hilgenkamp, Hans
Jan M. van Ruitenbeek
author_facet Atesci, Hasan
Coneri, Francesco
Leeuwenhoek, Maarten
Hilgenkamp, Hans
Jan M. van Ruitenbeek
topic К 100-летию со дня рождения И.М. Лифшица
topic_facet К 100-летию со дня рождения И.М. Лифшица
publishDate 2017
language English
container_title Физика низких температур
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
format Article
description Recently, ionic liquid gating has been used to modulate the charge carrier properties of metal oxides. The mechanism behind it, however, is still a matter of debate. In this paper, we report experiments on doped and undoped Nd₂CuO₄. We find major resistance drops of the bilayer coupled to observations of the presence of a considerable Faradeic component in the gate current and of the appearance of charge transfer peaks in the cyclic voltammetry data. This leads us to propose a mechanism of gating based on irreversible electrochemical reactions, likely due to trace amounts of contaminations present in the ionic liquid. This work is therefore in line with previous reports confirming the presence of irreversible electrochemistry in ionic liquid gated electron- doped cuprates.
issn 0132-6414
url https://nasplib.isofts.kiev.ua/handle/123456789/129380
citation_txt On the nature of ionic liquid gating of Nd₂CuO₄ thin films / Hasan Atesci, Francesco Coneri, Maarten Leeuwenhoek, Hans Hilgenkamp, Jan M. van Ruitenbeek // Физика низких температур. — 2017. — Т. 43, № 2. — С. 353-359. — Бібліогр.: 50 назв. — англ.
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