Intrinsically shunted Josephson junctions for electronics applications

Conventional Josephson metal-insulator-metal devices are inherently underdamped and exhibit hysteretic current -voltage response due to a very high subgap resistance compared to that in the normal state. At the same time, overdamped junctions with single-valued characteristics are needed for most su...

Повний опис

Збережено в:
Бібліографічні деталі
Опубліковано в: :Физика низких температур
Дата:2017
Автори: Belogolovskii, M., Zhitlukhina, E., Lacquaniti, V., De Leo, N., Fretto, M., Sosso, A.
Формат: Стаття
Мова:English
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2017
Теми:
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/129526
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Intrinsically shunted Josephson junctions for electronics applications / M. Belogolovskii, E. Zhitlukhina, V. Lacquaniti, N. De Leo, M. Fretto, A. Sosso // Физика низких температур. — 2017. — Т. 43, № 7. — С. 950-961. — Бібліогр.: 75 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-129526
record_format dspace
spelling Belogolovskii, M.
Zhitlukhina, E.
Lacquaniti, V.
De Leo, N.
Fretto, M.
Sosso, A.
2018-01-19T20:43:59Z
2018-01-19T20:43:59Z
2017
Intrinsically shunted Josephson junctions for electronics applications / M. Belogolovskii, E. Zhitlukhina, V. Lacquaniti, N. De Leo, M. Fretto, A. Sosso // Физика низких температур. — 2017. — Т. 43, № 7. — С. 950-961. — Бібліогр.: 75 назв. — англ.
0132-6414
PACS: 85.25.Cp, 73.23.–b, 68.55.aj
https://nasplib.isofts.kiev.ua/handle/123456789/129526
Conventional Josephson metal-insulator-metal devices are inherently underdamped and exhibit hysteretic current -voltage response due to a very high subgap resistance compared to that in the normal state. At the same time, overdamped junctions with single-valued characteristics are needed for most superconducting digital applications. The usual way to overcome the hysteretic behavior is to place an external low-resistance normal-metal shunt in parallel with each junction. Unfortunately, such solution results in a considerable complication of the circuitry design and introduces parasitic inductance through the junction. This paper provides a concise overview of some generic approaches that have been proposed in order to realize internal shunting in Josephson heterostructures with a barrier that itself contains the desired resistive component. The main attention is paid to self-shunted devices with local weak-link transmission probabilities that are so strongly disordered in the interface plane that transmission probabilities are tiny for the main part of the transition region between two super-conducting electrodes, while a small part of the interface is well transparent. We discuss the possibility of realizing a universal bimodal distribution function and emphasize advantages of such junctions that can be considered as a new class of self-shunted Josephson devices promising for practical applications in superconducting electronics operating at 4.2 K.
The study was carried out within the Fundamental Research Programme funded by the MES of Ukraine (Project No. 0117U002360).
en
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука
Intrinsically shunted Josephson junctions for electronics applications
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Intrinsically shunted Josephson junctions for electronics applications
spellingShingle Intrinsically shunted Josephson junctions for electronics applications
Belogolovskii, M.
Zhitlukhina, E.
Lacquaniti, V.
De Leo, N.
Fretto, M.
Sosso, A.
Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука
title_short Intrinsically shunted Josephson junctions for electronics applications
title_full Intrinsically shunted Josephson junctions for electronics applications
title_fullStr Intrinsically shunted Josephson junctions for electronics applications
title_full_unstemmed Intrinsically shunted Josephson junctions for electronics applications
title_sort intrinsically shunted josephson junctions for electronics applications
author Belogolovskii, M.
Zhitlukhina, E.
Lacquaniti, V.
De Leo, N.
Fretto, M.
Sosso, A.
author_facet Belogolovskii, M.
Zhitlukhina, E.
Lacquaniti, V.
De Leo, N.
Fretto, M.
Sosso, A.
topic Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука
topic_facet Сверхпроводящие и мезоскопические структуры. К 70-летию со дня рождения А.Н. Омельянчука
publishDate 2017
language English
container_title Физика низких температур
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
format Article
description Conventional Josephson metal-insulator-metal devices are inherently underdamped and exhibit hysteretic current -voltage response due to a very high subgap resistance compared to that in the normal state. At the same time, overdamped junctions with single-valued characteristics are needed for most superconducting digital applications. The usual way to overcome the hysteretic behavior is to place an external low-resistance normal-metal shunt in parallel with each junction. Unfortunately, such solution results in a considerable complication of the circuitry design and introduces parasitic inductance through the junction. This paper provides a concise overview of some generic approaches that have been proposed in order to realize internal shunting in Josephson heterostructures with a barrier that itself contains the desired resistive component. The main attention is paid to self-shunted devices with local weak-link transmission probabilities that are so strongly disordered in the interface plane that transmission probabilities are tiny for the main part of the transition region between two super-conducting electrodes, while a small part of the interface is well transparent. We discuss the possibility of realizing a universal bimodal distribution function and emphasize advantages of such junctions that can be considered as a new class of self-shunted Josephson devices promising for practical applications in superconducting electronics operating at 4.2 K.
issn 0132-6414
url https://nasplib.isofts.kiev.ua/handle/123456789/129526
citation_txt Intrinsically shunted Josephson junctions for electronics applications / M. Belogolovskii, E. Zhitlukhina, V. Lacquaniti, N. De Leo, M. Fretto, A. Sosso // Физика низких температур. — 2017. — Т. 43, № 7. — С. 950-961. — Бібліогр.: 75 назв. — англ.
work_keys_str_mv AT belogolovskiim intrinsicallyshuntedjosephsonjunctionsforelectronicsapplications
AT zhitlukhinae intrinsicallyshuntedjosephsonjunctionsforelectronicsapplications
AT lacquanitiv intrinsicallyshuntedjosephsonjunctionsforelectronicsapplications
AT deleon intrinsicallyshuntedjosephsonjunctionsforelectronicsapplications
AT frettom intrinsicallyshuntedjosephsonjunctionsforelectronicsapplications
AT sossoa intrinsicallyshuntedjosephsonjunctionsforelectronicsapplications
first_indexed 2025-12-07T19:16:25Z
last_indexed 2025-12-07T19:16:25Z
_version_ 1850878182278823936