Reentrance phenomenon in superconductor/ferromagnet nanostructures and their application in superconducting spin valves for superconducting electronics

In superconductor/ferromagnet layered structures, a Fulde–Ferrell–Larkin–Ovchinnikov-like inhomogeneous superconducting pairing give rise. The singlet and zero-projection triplet components of the pairing oscillate in space, and the presence of interfaces causes interference phenomena. As the result...

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Published in:Физика низких температур
Date:2017
Main Author: Sidorenko, A.S.
Format: Article
Language:English
Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2017
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/129527
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Reentrance phenomenon in superconductor/ferromagnet nanostructures and their application in superconducting spin valves for superconducting electronics / A.S. Sidorenko // Физика низких температур. — 2017. — Т. 43, № 7. — С. 962-968. — Бібліогр.: 50 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Summary:In superconductor/ferromagnet layered structures, a Fulde–Ferrell–Larkin–Ovchinnikov-like inhomogeneous superconducting pairing give rise. The singlet and zero-projection triplet components of the pairing oscillate in space, and the presence of interfaces causes interference phenomena. As the result of the interference, the super-conducting critical temperature Tc oscillates as a function of the ferromagnetic layer thicknesses or, even more spectacular, reentrant superconductivity appears. Two ferromagnetic layers can be combined with a superconducting layer into a superconducting spin valve. Proper design and choice of the material parameters give possibility to control superconducting Tc manipulating with magnetic configurations in the system. The conditions to get large spin-valve effect, i.e., a large shift in the critical temperature, are reviewed in the article.
ISSN:0132-6414