Reentrance phenomenon in superconductor/ferromagnet nanostructures and their application in superconducting spin valves for superconducting electronics
In superconductor/ferromagnet layered structures, a Fulde–Ferrell–Larkin–Ovchinnikov-like inhomogeneous superconducting pairing give rise. The singlet and zero-projection triplet components of the pairing oscillate in space, and the presence of interfaces causes interference phenomena. As the result...
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| Опубліковано в: : | Физика низких температур |
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| Дата: | 2017 |
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| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2017
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| Теми: | |
| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/129527 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Reentrance phenomenon in superconductor/ferromagnet nanostructures and their application in superconducting spin valves for superconducting electronics / A.S. Sidorenko // Физика низких температур. — 2017. — Т. 43, № 7. — С. 962-968. — Бібліогр.: 50 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | In superconductor/ferromagnet layered structures, a Fulde–Ferrell–Larkin–Ovchinnikov-like inhomogeneous superconducting pairing give rise. The singlet and zero-projection triplet components of the pairing oscillate in space, and the presence of interfaces causes interference phenomena. As the result of the interference, the super-conducting critical temperature Tc oscillates as a function of the ferromagnetic layer thicknesses or, even more spectacular, reentrant superconductivity appears. Two ferromagnetic layers can be combined with a superconducting layer into a superconducting spin valve. Proper design and choice of the material parameters give possibility to control superconducting Tc manipulating with magnetic configurations in the system. The conditions to get large spin-valve effect, i.e., a large shift in the critical temperature, are reviewed in the article.
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| ISSN: | 0132-6414 |