VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate

Using X-ray reflectometry method, the kinektics of solid state reactions at the surface of layered thin film nickel/Sisub system (effective nickel thickness 15 and 45 nm) under VUV irradiation of 8≤hv≤1.8 eV energy was studied. Nickel and nickel oxide layers have shown no changes both in thickness a...

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Опубліковано в: :Functional Materials
Дата:2006
Автори: Mikhailov, I.F., Malykhin, S.V., Borisova, S.S., Fomina, L.P.
Формат: Стаття
Мова:Англійська
Опубліковано: НТК «Інститут монокристалів» НАН України 2006
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/134056
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate / I.F. Mikhailov, S.V. Malykhin , S.S. Borisova , L.P. Fomina // Functional Materials. — 2006. — Т. 13, № 3. — С. 381-386. — Бібліогр.: 28 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Mikhailov, I.F.
Malykhin, S.V.
Borisova, S.S.
Fomina, L.P.
author_facet Mikhailov, I.F.
Malykhin, S.V.
Borisova, S.S.
Fomina, L.P.
citation_txt VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate / I.F. Mikhailov, S.V. Malykhin , S.S. Borisova , L.P. Fomina // Functional Materials. — 2006. — Т. 13, № 3. — С. 381-386. — Бібліогр.: 28 назв. — англ.
collection DSpace DC
container_title Functional Materials
description Using X-ray reflectometry method, the kinektics of solid state reactions at the surface of layered thin film nickel/Sisub system (effective nickel thickness 15 and 45 nm) under VUV irradiation of 8≤hv≤1.8 eV energy was studied. Nickel and nickel oxide layers have shown no changes both in thickness and sesity. As a result of VUV stimulated silicon diffusion from the substrate and of its reaction with nitrogen, a new layer of silicon nitride with of (3.2...3.4) g*cm⁻³ desity in formed at the nickel film surface. The silicon nitride formation reaction, where nickel acts as a catalyst, is of zero order typical of radiation-(photo)-chemical processes and stops at the layer thickness about 1.5 nm. After aging in air, the surface layer density decreases down to 2.3 g*cm⁻³ and thickness increases to about 25 nm due to oxidation. Repeated cycles of irradiation and oxidation result in degradation of the film-substrate system due to breakink the film adhesion
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spelling Mikhailov, I.F.
Malykhin, S.V.
Borisova, S.S.
Fomina, L.P.
2018-06-11T19:29:25Z
2018-06-11T19:29:25Z
2006
VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate / I.F. Mikhailov, S.V. Malykhin , S.S. Borisova , L.P. Fomina // Functional Materials. — 2006. — Т. 13, № 3. — С. 381-386. — Бібліогр.: 28 назв. — англ.
https://nasplib.isofts.kiev.ua/handle/123456789/134056
Using X-ray reflectometry method, the kinektics of solid state reactions at the surface of layered thin film nickel/Sisub system (effective nickel thickness 15 and 45 nm) under VUV irradiation of 8≤hv≤1.8 eV energy was studied. Nickel and nickel oxide layers have shown no changes both in thickness and sesity. As a result of VUV stimulated silicon diffusion from the substrate and of its reaction with nitrogen, a new layer of silicon nitride with of (3.2...3.4) g*cm⁻³ desity in formed at the nickel film surface. The silicon nitride formation reaction, where nickel acts as a catalyst, is of zero order typical of radiation-(photo)-chemical processes and stops at the layer thickness about 1.5 nm. After aging in air, the surface layer density decreases down to 2.3 g*cm⁻³ and thickness increases to about 25 nm due to oxidation. Repeated cycles of irradiation and oxidation result in degradation of the film-substrate system due to breakink the film adhesion
en
НТК «Інститут монокристалів» НАН України
Functional Materials
VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
Твердофазні реакції на поверхні наношарів нікелю, стимульовані ВУФ опроміненням
Article
published earlier
spellingShingle VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
Mikhailov, I.F.
Malykhin, S.V.
Borisova, S.S.
Fomina, L.P.
title VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
title_alt Твердофазні реакції на поверхні наношарів нікелю, стимульовані ВУФ опроміненням
title_full VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
title_fullStr VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
title_full_unstemmed VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
title_short VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
title_sort vuv stimulated solid-phase reactions on the surface on ni nano-layers on si substrate
url https://nasplib.isofts.kiev.ua/handle/123456789/134056
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