VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate

Using X-ray reflectometry method, the kinektics of solid state reactions at the surface of layered thin film nickel/Sisub system (effective nickel thickness 15 and 45 nm) under VUV irradiation of 8≤hv≤1.8 eV energy was studied. Nickel and nickel oxide layers have shown no changes both in thickness a...

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Veröffentlicht in:Functional Materials
Datum:2006
Hauptverfasser: Mikhailov, I.F., Malykhin, S.V., Borisova, S.S., Fomina, L.P.
Format: Artikel
Sprache:English
Veröffentlicht: НТК «Інститут монокристалів» НАН України 2006
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/134056
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate / I.F. Mikhailov, S.V. Malykhin , S.S. Borisova , L.P. Fomina // Functional Materials. — 2006. — Т. 13, № 3. — С. 381-386. — Бібліогр.: 28 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-134056
record_format dspace
spelling Mikhailov, I.F.
Malykhin, S.V.
Borisova, S.S.
Fomina, L.P.
2018-06-11T19:29:25Z
2018-06-11T19:29:25Z
2006
VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate / I.F. Mikhailov, S.V. Malykhin , S.S. Borisova , L.P. Fomina // Functional Materials. — 2006. — Т. 13, № 3. — С. 381-386. — Бібліогр.: 28 назв. — англ.
https://nasplib.isofts.kiev.ua/handle/123456789/134056
Using X-ray reflectometry method, the kinektics of solid state reactions at the surface of layered thin film nickel/Sisub system (effective nickel thickness 15 and 45 nm) under VUV irradiation of 8≤hv≤1.8 eV energy was studied. Nickel and nickel oxide layers have shown no changes both in thickness and sesity. As a result of VUV stimulated silicon diffusion from the substrate and of its reaction with nitrogen, a new layer of silicon nitride with of (3.2...3.4) g*cm⁻³ desity in formed at the nickel film surface. The silicon nitride formation reaction, where nickel acts as a catalyst, is of zero order typical of radiation-(photo)-chemical processes and stops at the layer thickness about 1.5 nm. After aging in air, the surface layer density decreases down to 2.3 g*cm⁻³ and thickness increases to about 25 nm due to oxidation. Repeated cycles of irradiation and oxidation result in degradation of the film-substrate system due to breakink the film adhesion
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НТК «Інститут монокристалів» НАН України
Functional Materials
VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
Твердофазні реакції на поверхні наношарів нікелю, стимульовані ВУФ опроміненням
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
spellingShingle VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
Mikhailov, I.F.
Malykhin, S.V.
Borisova, S.S.
Fomina, L.P.
title_short VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
title_full VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
title_fullStr VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
title_full_unstemmed VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate
title_sort vuv stimulated solid-phase reactions on the surface on ni nano-layers on si substrate
author Mikhailov, I.F.
Malykhin, S.V.
Borisova, S.S.
Fomina, L.P.
author_facet Mikhailov, I.F.
Malykhin, S.V.
Borisova, S.S.
Fomina, L.P.
publishDate 2006
language English
container_title Functional Materials
publisher НТК «Інститут монокристалів» НАН України
format Article
title_alt Твердофазні реакції на поверхні наношарів нікелю, стимульовані ВУФ опроміненням
description Using X-ray reflectometry method, the kinektics of solid state reactions at the surface of layered thin film nickel/Sisub system (effective nickel thickness 15 and 45 nm) under VUV irradiation of 8≤hv≤1.8 eV energy was studied. Nickel and nickel oxide layers have shown no changes both in thickness and sesity. As a result of VUV stimulated silicon diffusion from the substrate and of its reaction with nitrogen, a new layer of silicon nitride with of (3.2...3.4) g*cm⁻³ desity in formed at the nickel film surface. The silicon nitride formation reaction, where nickel acts as a catalyst, is of zero order typical of radiation-(photo)-chemical processes and stops at the layer thickness about 1.5 nm. After aging in air, the surface layer density decreases down to 2.3 g*cm⁻³ and thickness increases to about 25 nm due to oxidation. Repeated cycles of irradiation and oxidation result in degradation of the film-substrate system due to breakink the film adhesion
url https://nasplib.isofts.kiev.ua/handle/123456789/134056
citation_txt VUV stimulated solid-phase reactions on the surface on Ni nano-layers on Si substrate / I.F. Mikhailov, S.V. Malykhin , S.S. Borisova , L.P. Fomina // Functional Materials. — 2006. — Т. 13, № 3. — С. 381-386. — Бібліогр.: 28 назв. — англ.
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