X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector

• Published in: Functional Materials
• Date: 2010
• Main Authors: Mikhailov, I.F., Baturin, A.A., Fomina, L.P.
• Format: Article
• Language: English
• Published: НТК «Інститут монокристалів» НАН України 2010
• Subjects: Technology
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/134203
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector / I.F. Mikhailov, A.A. Baturin, L.P. Fomina // Functional Materials. — 2010. — Т. 17, № 1. — С. 127-130. — Бібліогр.: 2 назв. — англ.