X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector
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| Date: | 2010 |
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| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
НТК «Інститут монокристалів» НАН України
2010
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| Series: | Functional Materials |
| Subjects: | |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/134203 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | X-Ray fluorescence determination of impurity traces using a secondary emitter and a solid-state detector / I.F. Mikhailov, A.A. Baturin, L.P. Fomina // Functional Materials. — 2010. — Т. 17, № 1. — С. 127-130. — Бібліогр.: 2 назв. — англ. |