Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions
The influence of mechanical and chemical methods of CsI:TI and Nal:TI crystals surface treatment on their scintillation characteristics at registration of short-range ionizing radiation has been investigated. It is shown that application of ultrathin silicon dioxide powder obtained by sol-gel method...
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| Опубліковано в: : | Functional Materials |
|---|---|
| Дата: | 2006 |
| Автори: | , , , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2006
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/135015 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions / L.A. Andryushchenko, A.Yu. Boyarintsev, B.V. Grinyov, I.V. Kilimchuk, A.M. Kudin, V.A. Tarasov, Yu.T. Vyday // Functional Materials. — 2006. — Т. 13, № 3. — С. 534-537. — Бібліогр.: 10 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862555912887074816 |
|---|---|
| author | Andryushchenko, L.A. Boyarintsev, A.Yu. Grinyov, B.V. Kilimchuk, I.V. Kudin, A.M. Tarasov, V.A. Vyday, Yu.T. |
| author_facet | Andryushchenko, L.A. Boyarintsev, A.Yu. Grinyov, B.V. Kilimchuk, I.V. Kudin, A.M. Tarasov, V.A. Vyday, Yu.T. |
| citation_txt | Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions / L.A. Andryushchenko, A.Yu. Boyarintsev, B.V. Grinyov, I.V. Kilimchuk, A.M. Kudin, V.A. Tarasov, Yu.T. Vyday // Functional Materials. — 2006. — Т. 13, № 3. — С. 534-537. — Бібліогр.: 10 назв. — англ. |
| collection | DSpace DC |
| container_title | Functional Materials |
| description | The influence of mechanical and chemical methods of CsI:TI and Nal:TI crystals surface treatment on their scintillation characteristics at registration of short-range ionizing radiation has been investigated. It is shown that application of ultrathin silicon dioxide powder obtained by sol-gel method and organosilicon liquids at the polishing stage provides the near-surface layer of CsI:TI and NaI:TI crystals with minimum light yield nonuniformity. After grinding of the crystal surface, the stability of scintillation characteristics can be achieved by the surface treatment with tetraethoxy silane and oligo-(siloxane hydride) liquid. Application of thin-film organosilicon coating on the CsI:TI crystal surface turned to the radiation source has improved the pulse-height resolution by 3-5 % in the absolute value at registration of X-ray radiation with E = 5.9 keV.
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| first_indexed | 2025-11-25T22:33:31Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-135015 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1027-5495 |
| language | English |
| last_indexed | 2025-11-25T22:33:31Z |
| publishDate | 2006 |
| publisher | НТК «Інститут монокристалів» НАН України |
| record_format | dspace |
| spelling | Andryushchenko, L.A. Boyarintsev, A.Yu. Grinyov, B.V. Kilimchuk, I.V. Kudin, A.M. Tarasov, V.A. Vyday, Yu.T. 2018-06-14T13:25:17Z 2018-06-14T13:25:17Z 2006 Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions / L.A. Andryushchenko, A.Yu. Boyarintsev, B.V. Grinyov, I.V. Kilimchuk, A.M. Kudin, V.A. Tarasov, Yu.T. Vyday // Functional Materials. — 2006. — Т. 13, № 3. — С. 534-537. — Бібліогр.: 10 назв. — англ. 1027-5495 https://nasplib.isofts.kiev.ua/handle/123456789/135015 The influence of mechanical and chemical methods of CsI:TI and Nal:TI crystals surface treatment on their scintillation characteristics at registration of short-range ionizing radiation has been investigated. It is shown that application of ultrathin silicon dioxide powder obtained by sol-gel method and organosilicon liquids at the polishing stage provides the near-surface layer of CsI:TI and NaI:TI crystals with minimum light yield nonuniformity. After grinding of the crystal surface, the stability of scintillation characteristics can be achieved by the surface treatment with tetraethoxy silane and oligo-(siloxane hydride) liquid. Application of thin-film organosilicon coating on the CsI:TI crystal surface turned to the radiation source has improved the pulse-height resolution by 3-5 % in the absolute value at registration of X-ray radiation with E = 5.9 keV. en НТК «Інститут монокристалів» НАН України Functional Materials Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions Дослідження сцинтиляційних характеристик кристалів CsI:TI i Nal:TI при різних способах обробки поверхні Article published earlier |
| spellingShingle | Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions Andryushchenko, L.A. Boyarintsev, A.Yu. Grinyov, B.V. Kilimchuk, I.V. Kudin, A.M. Tarasov, V.A. Vyday, Yu.T. |
| title | Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions |
| title_alt | Дослідження сцинтиляційних характеристик кристалів CsI:TI i Nal:TI при різних способах обробки поверхні |
| title_full | Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions |
| title_fullStr | Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions |
| title_full_unstemmed | Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions |
| title_short | Investigation of scintillation characteristics for CsI:TI and Nal:TI crystals under different surface treatment conditions |
| title_sort | investigation of scintillation characteristics for csi:ti and nal:ti crystals under different surface treatment conditions |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/135015 |
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