Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration

Optimization of the primary filter in the scheme with fluorescent re-radiator was carried out using the minimum detection limit criterion Cmin. It was established experimentally, that the filtration provides three-fourfold increase for the contrast and 70 % gain for the detection limit. For All trac...

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Veröffentlicht in:Functional Materials
Datum:2012
Hauptverfasser: Mikhailov, I.F., Baturin, A.A., Mikhailov, A.I., Borisova, S.S.
Format: Artikel
Sprache:Englisch
Veröffentlicht: НТК «Інститут монокристалів» НАН України 2012
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Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/135279
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Zitieren:Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2012. — Т. 19, № 1. — С. 126-129. — Бібліогр.: 6 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Mikhailov, I.F.
Baturin, A.A.
Mikhailov, A.I.
Borisova, S.S.
author_facet Mikhailov, I.F.
Baturin, A.A.
Mikhailov, A.I.
Borisova, S.S.
citation_txt Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2012. — Т. 19, № 1. — С. 126-129. — Бібліогр.: 6 назв. — англ.
collection DSpace DC
container_title Functional Materials
description Optimization of the primary filter in the scheme with fluorescent re-radiator was carried out using the minimum detection limit criterion Cmin. It was established experimentally, that the filtration provides three-fourfold increase for the contrast and 70 % gain for the detection limit. For All trace impurities in ion-exchange resins, the achieved sensitivity about 1 ppm does not yield to values obtained in the complex Barkla scheme using polarized radiation.
first_indexed 2025-12-07T16:55:03Z
format Article
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1027-5495
language English
last_indexed 2025-12-07T16:55:03Z
publishDate 2012
publisher НТК «Інститут монокристалів» НАН України
record_format dspace
spelling Mikhailov, I.F.
Baturin, A.A.
Mikhailov, A.I.
Borisova, S.S.
2018-06-14T18:03:16Z
2018-06-14T18:03:16Z
2012
Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, S.S. Borisova // Functional Materials. — 2012. — Т. 19, № 1. — С. 126-129. — Бібліогр.: 6 назв. — англ.
1027-5495
https://nasplib.isofts.kiev.ua/handle/123456789/135279
Optimization of the primary filter in the scheme with fluorescent re-radiator was carried out using the minimum detection limit criterion Cmin. It was established experimentally, that the filtration provides three-fourfold increase for the contrast and 70 % gain for the detection limit. For All trace impurities in ion-exchange resins, the achieved sensitivity about 1 ppm does not yield to values obtained in the complex Barkla scheme using polarized radiation.
en
НТК «Інститут монокристалів» НАН України
Functional Materials
Devices and instruments
Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
Підвищення чутливості рентгенофлуоресцентної схеми з вторинним випромінювачем шляхом фільтрації первинного спектра
Article
published earlier
spellingShingle Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
Mikhailov, I.F.
Baturin, A.A.
Mikhailov, A.I.
Borisova, S.S.
Devices and instruments
title Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_alt Підвищення чутливості рентгенофлуоресцентної схеми з вторинним випромінювачем шляхом фільтрації первинного спектра
title_full Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_fullStr Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_full_unstemmed Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_short Increasing the sensitivity of X-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
title_sort increasing the sensitivity of x-ray fluorescent scheme with secondary radiator using the initial spectrum filtration
topic Devices and instruments
topic_facet Devices and instruments
url https://nasplib.isofts.kiev.ua/handle/123456789/135279
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