APA (7th ed.) Citation

Zaitsev, R., Kopach, V., Kirichenko, M., Doroshenko, A., & Khrypunov, G. (2011). Dependence of minority charge carriers lifetime on point defects type and their concentration in single-crystal silicon. Functional Materials.

Chicago Style (17th ed.) Citation

Zaitsev, R.V, V.R Kopach, M.V Kirichenko, A.N Doroshenko, and G.S Khrypunov. "Dependence of Minority Charge Carriers Lifetime on Point Defects Type and Their Concentration in Single-crystal Silicon." Functional Materials 2011.

MLA (8th ed.) Citation

Zaitsev, R.V, et al. "Dependence of Minority Charge Carriers Lifetime on Point Defects Type and Their Concentration in Single-crystal Silicon." Functional Materials, 2011.

Warning: These citations may not always be 100% accurate.