Zaitsev, R., Kopach, V., Kirichenko, M., Doroshenko, A., & Khrypunov, G. (2011). Dependence of minority charge carriers lifetime on point defects type and their concentration in single-crystal silicon. Functional Materials.
Chicago-Zitierstil (17. Ausg.)Zaitsev, R.V, V.R Kopach, M.V Kirichenko, A.N Doroshenko, und G.S Khrypunov. "Dependence of Minority Charge Carriers Lifetime on Point Defects Type and Their Concentration in Single-crystal Silicon." Functional Materials 2011.
MLA-Zitierstil (8. Ausg.)Zaitsev, R.V, et al. "Dependence of Minority Charge Carriers Lifetime on Point Defects Type and Their Concentration in Single-crystal Silicon." Functional Materials, 2011.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.