The aggregation of point defetc in dislocation-free silicon single crystals

The formation kinetics for grown-in microdefects nucleation centers in dislocation-free silicon single crystals has been considered. It has been demonstrated that the diffusion-controlled aggregation of point defects defines the process of grown-in microdefects formation. Decomposition of oversatura...

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Бібліографічні деталі
Опубліковано в: :Functional Materials
Дата:2007
Автори: Talanin, V.I., Talanin, I.E., Voronin, A.A., Sirota, A.V.
Формат: Стаття
Мова:Англійська
Опубліковано: НТК «Інститут монокристалів» НАН України 2007
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/136429
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:The aggregation of point defetc in dislocation-free silicon single crystals / V.I. Talanin, I.E. Talanin, A.A. Voronin, A.V. Sirota // Functional Materials. — 2007. — Т. 14, № 1. — С. 48-52. — Бібліогр.: 14 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862724110227865600
author Talanin, V.I.
Talanin, I.E.
Voronin, A.A.
Sirota, A.V.
author_facet Talanin, V.I.
Talanin, I.E.
Voronin, A.A.
Sirota, A.V.
citation_txt The aggregation of point defetc in dislocation-free silicon single crystals / V.I. Talanin, I.E. Talanin, A.A. Voronin, A.V. Sirota // Functional Materials. — 2007. — Т. 14, № 1. — С. 48-52. — Бібліогр.: 14 назв. — англ.
collection DSpace DC
container_title Functional Materials
description The formation kinetics for grown-in microdefects nucleation centers in dislocation-free silicon single crystals has been considered. It has been demonstrated that the diffusion-controlled aggregation of point defects defines the process of grown-in microdefects formation. Decomposition of oversaturated solid-state solution follows two mechanisms, namely vacancy-type and interstitial-type. Decomposition of oversaturated solid impurity solutions occurs at temperatures near the crystallization front, while decomposition of oversaturated solid solutions of intrinsic point defects is induced by crystal cooling (at T < 1200°C). The good consistency between theoretical and experimental results proves the validity of the proposed model for point defects aggregation.
first_indexed 2025-12-07T18:44:58Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-136429
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1027-5495
language English
last_indexed 2025-12-07T18:44:58Z
publishDate 2007
publisher НТК «Інститут монокристалів» НАН України
record_format dspace
spelling Talanin, V.I.
Talanin, I.E.
Voronin, A.A.
Sirota, A.V.
2018-06-16T12:18:04Z
2018-06-16T12:18:04Z
2007
The aggregation of point defetc in dislocation-free silicon single crystals / V.I. Talanin, I.E. Talanin, A.A. Voronin, A.V. Sirota // Functional Materials. — 2007. — Т. 14, № 1. — С. 48-52. — Бібліогр.: 14 назв. — англ.
1027-5495
https://nasplib.isofts.kiev.ua/handle/123456789/136429
The formation kinetics for grown-in microdefects nucleation centers in dislocation-free silicon single crystals has been considered. It has been demonstrated that the diffusion-controlled aggregation of point defects defines the process of grown-in microdefects formation. Decomposition of oversaturated solid-state solution follows two mechanisms, namely vacancy-type and interstitial-type. Decomposition of oversaturated solid impurity solutions occurs at temperatures near the crystallization front, while decomposition of oversaturated solid solutions of intrinsic point defects is induced by crystal cooling (at T < 1200°C). The good consistency between theoretical and experimental results proves the validity of the proposed model for point defects aggregation.
en
НТК «Інститут монокристалів» НАН України
Functional Materials
The aggregation of point defetc in dislocation-free silicon single crystals
Агрегація точкових дефектів у бездислокаційних монокристалах кремнію
Article
published earlier
spellingShingle The aggregation of point defetc in dislocation-free silicon single crystals
Talanin, V.I.
Talanin, I.E.
Voronin, A.A.
Sirota, A.V.
title The aggregation of point defetc in dislocation-free silicon single crystals
title_alt Агрегація точкових дефектів у бездислокаційних монокристалах кремнію
title_full The aggregation of point defetc in dislocation-free silicon single crystals
title_fullStr The aggregation of point defetc in dislocation-free silicon single crystals
title_full_unstemmed The aggregation of point defetc in dislocation-free silicon single crystals
title_short The aggregation of point defetc in dislocation-free silicon single crystals
title_sort aggregation of point defetc in dislocation-free silicon single crystals
url https://nasplib.isofts.kiev.ua/handle/123456789/136429
work_keys_str_mv AT talaninvi theaggregationofpointdefetcindislocationfreesiliconsinglecrystals
AT talaninie theaggregationofpointdefetcindislocationfreesiliconsinglecrystals
AT voroninaa theaggregationofpointdefetcindislocationfreesiliconsinglecrystals
AT sirotaav theaggregationofpointdefetcindislocationfreesiliconsinglecrystals
AT talaninvi agregacíâtočkovihdefektívubezdislokacíinihmonokristalahkremníû
AT talaninie agregacíâtočkovihdefektívubezdislokacíinihmonokristalahkremníû
AT voroninaa agregacíâtočkovihdefektívubezdislokacíinihmonokristalahkremníû
AT sirotaav agregacíâtočkovihdefektívubezdislokacíinihmonokristalahkremníû
AT talaninvi aggregationofpointdefetcindislocationfreesiliconsinglecrystals
AT talaninie aggregationofpointdefetcindislocationfreesiliconsinglecrystals
AT voroninaa aggregationofpointdefetcindislocationfreesiliconsinglecrystals
AT sirotaav aggregationofpointdefetcindislocationfreesiliconsinglecrystals