Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy

• Опубліковано в: : Functional Materials
• Дата: 2007
• Автори: Sheremeta, T.I., Prokopenko, I.V., Lytvyn, P.M., Lytvyn, O.S., Vodop`yanov, V.M., Bakhtinov, A.P., Shyn`ko, E.I.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: НТК «Інститут монокристалів» НАН України 2007
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/136447
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Peculiarities of the PbTe nano-islet formation on BaF₂ substrate at "hot wall" epitaxy method investigated by atomic force microscopy / T.I. Sheremeta, I.V. Prokopenko, P.M. Lytvyn, O.S. Lytvyn, V.M. Vodop`yanov, A.P. Bakhtinov, E.I. Shyn`ko // Functional Materials. — 2007. — Т. 14, № 1. — С. 86-91. — Бібліогр.: 9 назв. — англ.

Peculiarities of PbTe nano-islet films formation on BaF₂ (111) fresh cleavages by hot wall epitaxy deposition have been investigated using atomic force microscopy. It has been shown that various growth mechanisms could be realized by selection of proper temperature regimes in the growth chamber: gro...