Silicon crystal strength reduction due to magnetoresonance

The magnetoresonance influence as well as the micrawave superhigh-frequency (SHF) magnetic field effect on the microhardness of silicon crystals has been studied. It is established that the action of SHF field results in decreasing microhardness, which does not relax for initial value during a long...

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Бібліографічні деталі
Опубліковано в: :Functional Materials
Дата:2007
Автори: Makara, V.A., Pogorilyi, A.M., Steblenko, L.P., Kuryliuk, A.M., Naumenko, S.M., Kobzar, Yu.L., Kravets, A.F., Podyalovsky, D.I., Matveeva, O.V.
Формат: Стаття
Мова:English
Опубліковано: НТК «Інститут монокристалів» НАН України 2007
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/136494
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Silicon crystal strength reduction due to magnetoresonance / V.A. Makara, A.M. Pogorilyi, L.P. Steblenko, A.M. Kuryliuk, S.M. Naumenko, Yu.L. Kobzar, A.F. Kravets, D.I. Podyalovsky, O.V. Matveeva // Functional Materials. — 2007. — Т. 14, № 2. — С. 192-194. — Бібліогр.: 8 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-136494
record_format dspace
spelling Makara, V.A.
Pogorilyi, A.M.
Steblenko, L.P.
Kuryliuk, A.M.
Naumenko, S.M.
Kobzar, Yu.L.
Kravets, A.F.
Podyalovsky, D.I.
Matveeva, O.V.
2018-06-16T13:06:25Z
2018-06-16T13:06:25Z
2007
Silicon crystal strength reduction due to magnetoresonance / V.A. Makara, A.M. Pogorilyi, L.P. Steblenko, A.M. Kuryliuk, S.M. Naumenko, Yu.L. Kobzar, A.F. Kravets, D.I. Podyalovsky, O.V. Matveeva // Functional Materials. — 2007. — Т. 14, № 2. — С. 192-194. — Бібліогр.: 8 назв. — англ.
1027-5495
https://nasplib.isofts.kiev.ua/handle/123456789/136494
The magnetoresonance influence as well as the micrawave superhigh-frequency (SHF) magnetic field effect on the microhardness of silicon crystals has been studied. It is established that the action of SHF field results in decreasing microhardness, which does not relax for initial value during a long time (50 days). A mechanism has been suggested for the revealed effects.
en
НТК «Інститут монокристалів» НАН України
Functional Materials
Silicon crystal strength reduction due to magnetoresonance
Магніторезонансне знеміцнення кристалів кремнію
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Silicon crystal strength reduction due to magnetoresonance
spellingShingle Silicon crystal strength reduction due to magnetoresonance
Makara, V.A.
Pogorilyi, A.M.
Steblenko, L.P.
Kuryliuk, A.M.
Naumenko, S.M.
Kobzar, Yu.L.
Kravets, A.F.
Podyalovsky, D.I.
Matveeva, O.V.
title_short Silicon crystal strength reduction due to magnetoresonance
title_full Silicon crystal strength reduction due to magnetoresonance
title_fullStr Silicon crystal strength reduction due to magnetoresonance
title_full_unstemmed Silicon crystal strength reduction due to magnetoresonance
title_sort silicon crystal strength reduction due to magnetoresonance
author Makara, V.A.
Pogorilyi, A.M.
Steblenko, L.P.
Kuryliuk, A.M.
Naumenko, S.M.
Kobzar, Yu.L.
Kravets, A.F.
Podyalovsky, D.I.
Matveeva, O.V.
author_facet Makara, V.A.
Pogorilyi, A.M.
Steblenko, L.P.
Kuryliuk, A.M.
Naumenko, S.M.
Kobzar, Yu.L.
Kravets, A.F.
Podyalovsky, D.I.
Matveeva, O.V.
publishDate 2007
language English
container_title Functional Materials
publisher НТК «Інститут монокристалів» НАН України
format Article
title_alt Магніторезонансне знеміцнення кристалів кремнію
description The magnetoresonance influence as well as the micrawave superhigh-frequency (SHF) magnetic field effect on the microhardness of silicon crystals has been studied. It is established that the action of SHF field results in decreasing microhardness, which does not relax for initial value during a long time (50 days). A mechanism has been suggested for the revealed effects.
issn 1027-5495
url https://nasplib.isofts.kiev.ua/handle/123456789/136494
citation_txt Silicon crystal strength reduction due to magnetoresonance / V.A. Makara, A.M. Pogorilyi, L.P. Steblenko, A.M. Kuryliuk, S.M. Naumenko, Yu.L. Kobzar, A.F. Kravets, D.I. Podyalovsky, O.V. Matveeva // Functional Materials. — 2007. — Т. 14, № 2. — С. 192-194. — Бібліогр.: 8 назв. — англ.
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first_indexed 2025-12-07T16:46:13Z
last_indexed 2025-12-07T16:46:13Z
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