Optical properties of Ge-As-S thin films
Thin Ge-As-S films have been prepared by thermal vacuum evaporation. Optical parameters and thickness values of the films have been calculated basing on transmission spectra. The dispersion dependences of the refractive index have been shown to be described well by the single oscillator model. The o...
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| Veröffentlicht in: | Functional Materials |
|---|---|
| Datum: | 2009 |
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
НТК «Інститут монокристалів» НАН України
2009
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| Schlagworte: | |
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/136625 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Optical properties of Ge-As-S thin films // I.D. Tolmachov, A.V. Stronski // Functional Materials. — 2009. — Т. 16, № 1. — С. 32-35. — Бібліогр.: 6 назв. — англ. |