On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples
The technique of X-ray diffraction investigation of coherence length and micro-strain level using approximation of diffraction line profiles by Gaussian and Cauchy functions as well as by harmonic analysis has been worked out for tungsten samples with quite perfect structure. The importance of right...
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| Veröffentlicht in: | Functional Materials |
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| Datum: | 2017 |
| Hauptverfasser: | , , , , , |
| Format: | Artikel |
| Sprache: | Englisch |
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НТК «Інститут монокристалів» НАН України
2017
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/136677 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples / S.V. Malykhin, I.E. Garkusha, V.A. Makhlay, S.V. Surovitsky, M.V. Reshetnyak, S.S. Borisova // Functional Materials. — 2017. — Т. 24, № 1. — С. 179-183. — Бібліогр.: 15 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862708985861242880 |
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| author | Malykhin, S.V. Garkusha, I.E. Makhlay, V.A. Surovitsky, S.V. Reshetnyak, M.V. Borisova, S.S. |
| author_facet | Malykhin, S.V. Garkusha, I.E. Makhlay, V.A. Surovitsky, S.V. Reshetnyak, M.V. Borisova, S.S. |
| citation_txt | On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples / S.V. Malykhin, I.E. Garkusha, V.A. Makhlay, S.V. Surovitsky, M.V. Reshetnyak, S.S. Borisova // Functional Materials. — 2017. — Т. 24, № 1. — С. 179-183. — Бібліогр.: 15 назв. — англ. |
| collection | DSpace DC |
| container_title | Functional Materials |
| description | The technique of X-ray diffraction investigation of coherence length and micro-strain level using approximation of diffraction line profiles by Gaussian and Cauchy functions as well as by harmonic analysis has been worked out for tungsten samples with quite perfect structure. The importance of right choice of a standard for obtaining the reasonable measurement results has been demonstrated. For the first approximation the possibility to use the spectral line width for calculation of the reflection true (physical) broadening has been shown. The contributions of basic instrumental factors into the reflection geometric broadening were estimated.
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| first_indexed | 2025-12-07T17:14:50Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-136677 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1027-5495 |
| language | English |
| last_indexed | 2025-12-07T17:14:50Z |
| publishDate | 2017 |
| publisher | НТК «Інститут монокристалів» НАН України |
| record_format | dspace |
| spelling | Malykhin, S.V. Garkusha, I.E. Makhlay, V.A. Surovitsky, S.V. Reshetnyak, M.V. Borisova, S.S. 2018-06-16T15:03:57Z 2018-06-16T15:03:57Z 2017 On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples / S.V. Malykhin, I.E. Garkusha, V.A. Makhlay, S.V. Surovitsky, M.V. Reshetnyak, S.S. Borisova // Functional Materials. — 2017. — Т. 24, № 1. — С. 179-183. — Бібліогр.: 15 назв. — англ. 1027-5495 DOI: https://doi.org/10.15407/fm24.01.179 https://nasplib.isofts.kiev.ua/handle/123456789/136677 The technique of X-ray diffraction investigation of coherence length and micro-strain level using approximation of diffraction line profiles by Gaussian and Cauchy functions as well as by harmonic analysis has been worked out for tungsten samples with quite perfect structure. The importance of right choice of a standard for obtaining the reasonable measurement results has been demonstrated. For the first approximation the possibility to use the spectral line width for calculation of the reflection true (physical) broadening has been shown. The contributions of basic instrumental factors into the reflection geometric broadening were estimated. en НТК «Інститут монокристалів» НАН України Functional Materials Devices and instruments On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples Article published earlier |
| spellingShingle | On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples Malykhin, S.V. Garkusha, I.E. Makhlay, V.A. Surovitsky, S.V. Reshetnyak, M.V. Borisova, S.S. Devices and instruments |
| title | On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples |
| title_full | On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples |
| title_fullStr | On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples |
| title_full_unstemmed | On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples |
| title_short | On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples |
| title_sort | on application of x-ray aproximation method for studying the substructure of sufficiently perfect samples |
| topic | Devices and instruments |
| topic_facet | Devices and instruments |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/136677 |
| work_keys_str_mv | AT malykhinsv onapplicationofxrayaproximationmethodforstudyingthesubstructureofsufficientlyperfectsamples AT garkushaie onapplicationofxrayaproximationmethodforstudyingthesubstructureofsufficientlyperfectsamples AT makhlayva onapplicationofxrayaproximationmethodforstudyingthesubstructureofsufficientlyperfectsamples AT surovitskysv onapplicationofxrayaproximationmethodforstudyingthesubstructureofsufficientlyperfectsamples AT reshetnyakmv onapplicationofxrayaproximationmethodforstudyingthesubstructureofsufficientlyperfectsamples AT borisovass onapplicationofxrayaproximationmethodforstudyingthesubstructureofsufficientlyperfectsamples |