On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples

• Veröffentlicht in: Functional Materials
• Datum: 2017
• Hauptverfasser: Malykhin, S.V., Garkusha, I.E., Makhlay, V.A., Surovitsky, S.V., Reshetnyak, M.V., Borisova, S.S.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: НТК «Інститут монокристалів» НАН України 2017
• Schlagworte: Devices and instruments
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/136677
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples / S.V. Malykhin, I.E. Garkusha, V.A. Makhlay, S.V. Surovitsky, M.V. Reshetnyak, S.S. Borisova // Functional Materials. — 2017. — Т. 24, № 1. — С. 179-183. — Бібліогр.: 15 назв. — англ.

The technique of X-ray diffraction investigation of coherence length and micro-strain level using approximation of diffraction line profiles by Gaussian and Cauchy functions as well as by harmonic analysis has been worked out for tungsten samples with quite perfect structure. The importance of right...