Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers

• Опубліковано в: : Functional Materials
• Дата: 2017
• Автори: Kondrat, O., Holomb, R., Mitsa, V., Veres, M., Tsud, N.
• Формат: Стаття
• Мова: English
• Опубліковано: НТК «Інститут монокристалів» НАН України 2017
• Теми: Characterization and properties
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/136885
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Structural investigation of As-Se chalcogenide thin films with different compositions: formation, characterization and peculiarities of volume and near-surface nanolayers / O. Kondrat, R. Holomb, V. Mitsa, M. Veres, N. Tsud // Functional Materials. — 2017. — Т. 24, № 4. — С. 547-554. — Бібліогр.: 32 назв. — англ.

As₂₀Se₈₀, As₄₀Se₆₀ and As₅₀Se₅₀ films were studied by Raman spectroscopy in order to examine the local- and medium-range order of the structure. In addition, X-ray photoelectron, Raman and surface enhanced Raman spectroscopy were used to characterize the structural peculiarities at the top surface o...