Structure perfection of bulk and near-surface layers in sapphire single crystals

Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing atmosphere by the Czochralski technique and machined and annealed in various m...

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Published in:Functional Materials
Date:2007
Main Authors: Tkachenko, V.F., Puzikov, V.M., Dan`ko, A.Ya., Budnikov, A.T., Lukienko, O.A.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2007
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/136939
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Structure perfection of bulk and near-surface layers in sapphire single crystals / V.F. Tkachenko, V.M. Puzikov, A.Ya. Dan`ko, A.T. Budnikov, O.A. Lukienko // Functional Materials. — 2007. — Т. 14, № 4. — С. 550-554. — Бібліогр.: 7 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Tkachenko, V.F.
Puzikov, V.M.
Dan`ko, A.Ya.
Budnikov, A.T.
Lukienko, O.A.
author_facet Tkachenko, V.F.
Puzikov, V.M.
Dan`ko, A.Ya.
Budnikov, A.T.
Lukienko, O.A.
citation_txt Structure perfection of bulk and near-surface layers in sapphire single crystals / V.F. Tkachenko, V.M. Puzikov, A.Ya. Dan`ko, A.T. Budnikov, O.A. Lukienko // Functional Materials. — 2007. — Т. 14, № 4. — С. 550-554. — Бібліогр.: 7 назв. — англ.
collection DSpace DC
container_title Functional Materials
description Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing atmosphere by the Czochralski technique and machined and annealed in various manners.
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language English
last_indexed 2025-11-30T10:39:26Z
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publisher НТК «Інститут монокристалів» НАН України
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spelling Tkachenko, V.F.
Puzikov, V.M.
Dan`ko, A.Ya.
Budnikov, A.T.
Lukienko, O.A.
2018-06-16T17:55:02Z
2018-06-16T17:55:02Z
2007
Structure perfection of bulk and near-surface layers in sapphire single crystals / V.F. Tkachenko, V.M. Puzikov, A.Ya. Dan`ko, A.T. Budnikov, O.A. Lukienko // Functional Materials. — 2007. — Т. 14, № 4. — С. 550-554. — Бібліогр.: 7 назв. — англ.
1027-5495
https://nasplib.isofts.kiev.ua/handle/123456789/136939
Triple-crystal X-ray diffractometry has been used to study the structure perfection in bulk and surface layer of basal-oriented sapphire single crystals grown using horizontal directional crystallization (HDC) in reducing atmosphere by the Czochralski technique and machined and annealed in various manners.
en
НТК «Інститут монокристалів» НАН України
Functional Materials
Technology
Structure perfection of bulk and near-surface layers in sapphire single crystals
Досконалість структури об'єму та приповрхневих шарів монокристалів сапфіру
Article
published earlier
spellingShingle Structure perfection of bulk and near-surface layers in sapphire single crystals
Tkachenko, V.F.
Puzikov, V.M.
Dan`ko, A.Ya.
Budnikov, A.T.
Lukienko, O.A.
Technology
title Structure perfection of bulk and near-surface layers in sapphire single crystals
title_alt Досконалість структури об'єму та приповрхневих шарів монокристалів сапфіру
title_full Structure perfection of bulk and near-surface layers in sapphire single crystals
title_fullStr Structure perfection of bulk and near-surface layers in sapphire single crystals
title_full_unstemmed Structure perfection of bulk and near-surface layers in sapphire single crystals
title_short Structure perfection of bulk and near-surface layers in sapphire single crystals
title_sort structure perfection of bulk and near-surface layers in sapphire single crystals
topic Technology
topic_facet Technology
url https://nasplib.isofts.kiev.ua/handle/123456789/136939
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