Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy
The nanostructured silicon surface has been studied using the scanning tunnel microscopy and spectroscopy in air. The local density of electron states was defined as normalized differential tunnel conductivity (dI/dU)(I/U). The surface morphology has been found to be characterized by the presence of...
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| Veröffentlicht in: | Functional Materials |
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| Datum: | 2008 |
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | Englisch |
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НТК «Інститут монокристалів» НАН України
2008
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/137225 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy / S.P. Kulyk, M.M. Melnichenko, K.V. Svezhentsova, O.M. Shmyryova // Functional Materials. — 2008. — Т. 15, № 1. — С. 74-77. — Бібліогр.: 6 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862624317415620608 |
|---|---|
| author | Kulyk, S.P. Melnichenko, M.M. Svezhentsova, K.V. Shmyryova, O.M. |
| author_facet | Kulyk, S.P. Melnichenko, M.M. Svezhentsova, K.V. Shmyryova, O.M. |
| citation_txt | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy / S.P. Kulyk, M.M. Melnichenko, K.V. Svezhentsova, O.M. Shmyryova // Functional Materials. — 2008. — Т. 15, № 1. — С. 74-77. — Бібліогр.: 6 назв. — англ. |
| collection | DSpace DC |
| container_title | Functional Materials |
| description | The nanostructured silicon surface has been studied using the scanning tunnel microscopy and spectroscopy in air. The local density of electron states was defined as normalized differential tunnel conductivity (dI/dU)(I/U). The surface morphology has been found to be characterized by the presence of a homogeneous nanostructure on the initial substrate microrelief. For the first time it has been shown that the spectrum of electron states changes considerably during the growth of a nanostructured silicon film.
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| first_indexed | 2025-12-07T13:32:18Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-137225 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1027-5495 |
| language | English |
| last_indexed | 2025-12-07T13:32:18Z |
| publishDate | 2008 |
| publisher | НТК «Інститут монокристалів» НАН України |
| record_format | dspace |
| spelling | Kulyk, S.P. Melnichenko, M.M. Svezhentsova, K.V. Shmyryova, O.M. 2018-06-17T09:08:19Z 2018-06-17T09:08:19Z 2008 Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy / S.P. Kulyk, M.M. Melnichenko, K.V. Svezhentsova, O.M. Shmyryova // Functional Materials. — 2008. — Т. 15, № 1. — С. 74-77. — Бібліогр.: 6 назв. — англ. 1027-5495 https://nasplib.isofts.kiev.ua/handle/123456789/137225 The nanostructured silicon surface has been studied using the scanning tunnel microscopy and spectroscopy in air. The local density of electron states was defined as normalized differential tunnel conductivity (dI/dU)(I/U). The surface morphology has been found to be characterized by the presence of a homogeneous nanostructure on the initial substrate microrelief. For the first time it has been shown that the spectrum of electron states changes considerably during the growth of a nanostructured silicon film. en НТК «Інститут монокристалів» НАН України Functional Materials Characterization and properties Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy Вивчення наноструктурованих плівок монокристалічного кремнію методом сканувальної тунельної спектроскопії Article published earlier |
| spellingShingle | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy Kulyk, S.P. Melnichenko, M.M. Svezhentsova, K.V. Shmyryova, O.M. Characterization and properties |
| title | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_alt | Вивчення наноструктурованих плівок монокристалічного кремнію методом сканувальної тунельної спектроскопії |
| title_full | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_fullStr | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_full_unstemmed | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_short | Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| title_sort | study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy |
| topic | Characterization and properties |
| topic_facet | Characterization and properties |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/137225 |
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