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Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy

The nanostructured silicon surface has been studied using the scanning tunnel microscopy and spectroscopy in air. The local density of electron states was defined as normalized differential tunnel conductivity (dI/dU)(I/U). The surface morphology has been found to be characterized by the presence of...

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Veröffentlicht in:Functional Materials
Datum:2008
Hauptverfasser: Kulyk, S.P., Melnichenko, M.M., Svezhentsova, K.V., Shmyryova, O.M.
Format: Artikel
Sprache:Englisch
Veröffentlicht: НТК «Інститут монокристалів» НАН України 2008
Schlagworte:
Characterization and properties
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/137225
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy / S.P. Kulyk, M.M. Melnichenko, K.V. Svezhentsova, O.M. Shmyryova // Functional Materials. — 2008. — Т. 15, № 1. — С. 74-77. — Бібліогр.: 6 назв. — англ.

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