Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy

• Published in: Functional Materials
• Date: 2008
• Main Authors: Kulyk, S.P., Melnichenko, M.M., Svezhentsova, K.V., Shmyryova, O.M.
• Format: Article
• Language: English
• Published: НТК «Інститут монокристалів» НАН України 2008
• Subjects: Characterization and properties
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/137225
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Study of nanostructured layers of single-crystal silicon by scanning tunnel spectroscopy / S.P. Kulyk, M.M. Melnichenko, K.V. Svezhentsova, O.M. Shmyryova // Functional Materials. — 2008. — Т. 15, № 1. — С. 74-77. — Бібліогр.: 6 назв. — англ.

The nanostructured silicon surface has been studied using the scanning tunnel microscopy and spectroscopy in air. The local density of electron states was defined as normalized differential tunnel conductivity (dI/dU)(I/U). The surface morphology has been found to be characterized by the presence of...