TMR, MRE, and X-ray photoelectron spectroscopy of Fe-SiO₂ granular films

• Veröffentlicht in: Functional Materials
• Datum: 2005
• Hauptverfasser: Kravets, V.G., Poperenko, L.V., Vinnichenko, K.L.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: НТК «Інститут монокристалів» НАН України 2005
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/137251
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: TMR, MRE, and X-ray photoelectron spectroscopy of Fe-SiO₂ granular films / V.G. Kravets, L.V. Poperenko, K.L. Vinnichenko // Functional Materials. — 2005. — Т. 12, № 2. — С. 328-333. — Бібліогр.: 14 назв. — англ.

Feₓ(Si0₂)₁₋ₓ magnetic granular films below the percolation threshold (х < 0.45) have been studied using tunneling magnetoresistance (TMR), magnetorefractive effect (MRE),
 and X-ray photoelectron spectroscopy. Maximum magnetoresistance ratio of 3.7 % at room temperature was...