XPS and ESR study of tantalum nanoparticles
The electron structure of the films formed by ensemble of tantalum nanoparticles has been studied using XPS and EPR methods. Spectra of internal atomic levels of the film surface have been obtained using step-by-step annealing in vacuum. Using Ta4f spectra decomposition into components, the kinetics...
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| Veröffentlicht in: | Functional Materials |
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| Datum: | 2004 |
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
НТК «Інститут монокристалів» НАН України
2004
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/139433 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | XPS and ESR study of tantalum nanoparticles / A.P. Shpak, A.M. Korduban, V.V. Trachevsky // Functional Materials. — 2004. — Т. 11, № 3. — С. 451-453. — Бібліогр.: 4 назв. — англ. |