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XPS and ESR study of tantalum nanoparticles

The electron structure of the films formed by ensemble of tantalum nanoparticles has been studied using XPS and EPR methods. Spectra of internal atomic levels of the film surface have been obtained using step-by-step annealing in vacuum. Using Ta4f spectra decomposition into components, the kinetics...

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Bibliographic Details
Published in:	Functional Materials
Date:	2004
Main Authors:	Shpak, A.P., Korduban, A.M., Trachevsky, V.V.
Format:	Article
Language:	English
Published:	НТК «Інститут монокристалів» НАН України 2004
Online Access:	https://nasplib.isofts.kiev.ua/handle/123456789/139433
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Journal Title:	Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:	XPS and ESR study of tantalum nanoparticles / A.P. Shpak, A.M. Korduban, V.V. Trachevsky // Functional Materials. — 2004. — Т. 11, № 3. — С. 451-453. — Бібліогр.: 4 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine

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