Influence of Si on microstructure and mechanical properties of TiAISiN hard thin films
Structural and mechanical properties of nanocomposite TiAI(Si)N thin films prepared using arc-plasma PVD deposition technique on WC-Co substrates have been characterized by X-ray diffraction and nanoindentation. TEM have been used to study the microstructure of thin films, in order to understand the...
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| Datum: | 2004 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
НТК «Інститут монокристалів» НАН України
2004
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| Schriftenreihe: | Functional Materials |
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/139468 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Influence of Si on microstructure and mechanical properties of TiAISiN hard thin films / O.I. Nakonechna, M.I. Zakharenko // Functional Materials. — 2004. — Т. 11, № 3. — С. 541-545. — Бібліогр.: 17 назв. — англ. |