Ellipsometric plasmon sensor for adsorbed layers on thin Ag and Au films

• Veröffentlicht in: Functional Materials
• Datum: 2005
• Hauptverfasser: Severynov, V.L., Shaikevich, I.A., Shybiko, Y.A.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: НТК «Інститут монокристалів» НАН України 2005
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/139715
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Ellipsometric plasmon sensor for adsorbed layers on thin Ag and Au films / V.L. Severynov, I.A. Shaikevich, Y.A. Shybiko // Functional Materials. — 2005. — Т. 12, № 1. — С. 131-132. — Бібліогр.: 4 назв. — англ.

Using Kretschmann’s method, important parameters defining the propagation of surface waves (namely, the restored polarization azimuth ψ and phase difference Δ between p- and s-components of the electromagnetic wave) versus the light incidence angle θ for thin Ag and Au films have been investigated....