Determination of optical parameters of CdTe films by principal angle ellypsometry
The principal angle and ellipticity of the light wave reflected from the surface of the single-crystal silicon coated by a CdTe film have been measured in 366-579 nm spectral region. Using a specially developed computer graphic program of the ellipsometric data processing optical constants and a fil...
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| Veröffentlicht in: | Functional Materials |
|---|---|
| Datum: | 2006 |
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
НТК «Інститут монокристалів» НАН України
2006
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/139957 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Determination of optical parameters of CdTe films by principal angle ellypsometry / K.N. Kornienko, V.A. Odarych, L.V. Poperenko, N.V. Vuichik // Functional Materials. — 2006. — Т. 13, № 1. — С. 179-182. — Бібліогр.: 7 назв. — англ. |