Determination of optical parameters of CdTe films by principal angle ellypsometry

• Veröffentlicht in: Functional Materials
• Datum: 2006
• Hauptverfasser: Kornienko, K.N., Odarych, V.A., Poperenko, L.V., Vuichik, N.V.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: НТК «Інститут монокристалів» НАН України 2006
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/139957
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Determination of optical parameters of CdTe films by principal angle ellypsometry / K.N. Kornienko, V.A. Odarych, L.V. Poperenko, N.V. Vuichik // Functional Materials. — 2006. — Т. 13, № 1. — С. 179-182. — Бібліогр.: 7 назв. — англ.

The principal angle and ellipticity of the light wave reflected from the surface of the single-crystal silicon coated by a CdTe film have been measured in 366-579 nm spectral region. Using a specially developed computer graphic program of the ellipsometric data processing optical constants and a fil...