Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation
The 80 Å and 100 Å thick Cr films and 45 Å thick Ti ones were obtained bу the vacuum evaporation on glass substrates. The ellipsometric parameter ψ (azimuth of the restored linear polarization ψ) was measured at λ = 546.1 nm both at the air side and the glass one under various angles of incidence. I...
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| Veröffentlicht in: | Functional Materials |
|---|---|
| Datum: | 2006 |
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
НТК «Інститут монокристалів» НАН України
2006
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/139962 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation / Ya.A. Shybiko, I.A. Shaykevich, L.Yu. Melnichenko // Functional Materials. — 2006. — Т. 13, № 1. — С. 161-163. — Бібліогр.: 6 назв. — англ. |