Liubchenko, O., & Kladko, V. (2018). Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness. Металлофизика и новейшие технологии.
Chicago-Zitierstil (17. Ausg.)Liubchenko, O.I, und V.P Kladko. "Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness." Металлофизика и новейшие технологии 2018.
MLA-Zitierstil (8. Ausg.)Liubchenko, O.I, und V.P Kladko. "Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness." Металлофизика и новейшие технологии, 2018.