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APA (7th ed.) Citation

Liubchenko, O., & Kladko, V. (2018). Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness. Металлофизика и новейшие технологии.

Chicago Style (17th ed.) Citation

Liubchenko, O.I, and V.P Kladko. "Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness." Металлофизика и новейшие технологии 2018.

MLA (8th ed.) Citation

Liubchenko, O.I, and V.P Kladko. "Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness." Металлофизика и новейшие технологии, 2018.