Liubchenko, O., & Kladko, V. (2018). Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness. Металлофизика и новейшие технологии.
Чикаго стиль цитування (17-те видання)Liubchenko, O.I, та V.P Kladko. "Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness." Металлофизика и новейшие технологии 2018.
Стиль цитування MLA (8-ме видання)Liubchenko, O.I, та V.P Kladko. "Simulation of X-Ray Diffraction Spectra for AlN/GaN Multiple Quantum Well Structures on AlN(0001) with Interface Roughness and Variation of Vertical Layers Thickness." Металлофизика и новейшие технологии, 2018.