Pseudo-ring tests resolution for dynamic single faults in word-oriented memory

• Published in: Технология и конструирование в электронной аппаратуре
• Date: 2018
• Main Authors: Gritcov, S.S., Sorokin, G.F., Shestacova, T.V.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2018
• Subjects: Современные электронные технологии
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/150282
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Pseudo-ring tests resolution for dynamic single faults in word-oriented memory / S.S. Gritcov, G.F. Sorokin, T.V. Shestacova // Технология и конструирование в электронной аппаратуре. — 2018. — № 5-6. — С. 3-9. — Бібліогр.: 15 назв. — англ.

This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution dete...