High-pressure DC resistance of ZrO₂

The resistance and thermoelectromotive force (TEMF) of Y₂O₃-stabilized ZrO₂ have been investigated in the pressure and temperature range between 15 and 50 GPa, and 77 and 400 K, respectively. At a pressure of about 35 GPa the resistance of the sample decreases by 3-4 orders of magnitude. At a pressu...

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Published in:Физика и техника высоких давлений
Date:2003
Main Authors: Babushkin, A.N., Hochheimer, H.D., Korionov, I.V., Volkova, Y.Y., Wolf, G.H.
Format: Article
Language:English
Published: Донецький фізико-технічний інститут ім. О.О. Галкіна НАН України 2003
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/168002
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Cite this:High-pressure DC resistance of ZrO₂ / A.N. Babushkin, H.D. Hochheimer, I.V. Korionov, Y.Y. Volkova, G.H. Wolf // Физика и техника высоких давлений. — 2003. — Т. 13, № 3. — С. 7-10. — Бібліогр.: 6 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Babushkin, A.N.
Hochheimer, H.D.
Korionov, I.V.
Volkova, Y.Y.
Wolf, G.H.
author_facet Babushkin, A.N.
Hochheimer, H.D.
Korionov, I.V.
Volkova, Y.Y.
Wolf, G.H.
citation_txt High-pressure DC resistance of ZrO₂ / A.N. Babushkin, H.D. Hochheimer, I.V. Korionov, Y.Y. Volkova, G.H. Wolf // Физика и техника высоких давлений. — 2003. — Т. 13, № 3. — С. 7-10. — Бібліогр.: 6 назв. — англ.
collection DSpace DC
container_title Физика и техника высоких давлений
description The resistance and thermoelectromotive force (TEMF) of Y₂O₃-stabilized ZrO₂ have been investigated in the pressure and temperature range between 15 and 50 GPa, and 77 and 400 K, respectively. At a pressure of about 35 GPa the resistance of the sample decreases by 3-4 orders of magnitude. At a pressure of about 42 GPa the anomalies in the pressure dependence of the resistance, TEMF and of the parameters which depend on the concentration, mobility, and activation energy of the charge carriers were found.
first_indexed 2025-12-07T18:51:00Z
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fulltext Физика и техника высоких давлений 2003, том 13, № 3 7 PACS: 71.30.+h, 71.55.Ht, 72.20.i A.N. Babushkin1, H.D. Hochheimer2, I.V. Korionov2, Y.Y. Volkova2, G.H. Wolf3 HIGH-PRESSURE DC RESISTANCE OF ZrO2 1Department of Physics, Ural State University Ekaterinburg, 620083, Russia E-mail: alexey.babushkin@usu.ru 2Department of Physics, Colorado State University Fort Collins, CO 80523, USA 3Department of Chemistry and Biochemistry, Arizona State University Tempe, AZ 85287, USA Received July 7, 2003 The resistance and thermoelectromotive force (TEMF) of Y2O3-stabilized ZrO2 have been investigated in the pressure and temperature range between 15 and 50 GPa, and 77 and 400 K, respectively. At a pressure of about 35 GPa the resistance of the sample decreases by 34 orders of magnitude. At a pressure of about 42 GPa the anomalies in the pressure dependence of the resistance, TEMF and of the parameters which depend on the concentra- tion, mobility, and activation energy of the charge carriers were found. 1. Introduction Zirconia has rather interesting properties. This material is the major component in the best-known fuel cell materials. Furthermore, it has been suggested that high- density ZrO2 is a candidate for potentially very hard materials [1]. At high tem- peratures, pure ZrO2 crystallizes in the cubic fluorite structure. On cooling, it un- dergoes a displacive transformation to a related tetragonal fluorite structure and then, via a martensitic transition, to a monoclinic baddeleyite-type structure. The cubic and tetragonal fluorite phases, which exhibit the highest ionic conductivities, can be stabilized at room temperature by the addition of a small amount (< 15 mol %) of Y2O3 (or other oxides). Previous studies on the high-pressure behavior of pure ZrO2 indicate successive transformations to two different orthorhombic phases (ortho-I and ortho-II) [2]. Ortho-I is a distorted fluorite structure and orhto- II is a dense PbCl2-type structure. Recent work by Ohtaka et al. [1] suggests that the monoclinic-ortho-I and ortho-I-ortho-II phase boundaries occur at about 4 and 12 GPa, respectively, for pure ZrO2 near the room temperature. However, the latter (reconstructive) transition is extremely sluggish and a large pressure range of me- Физика и техника высоких давлений 2003, том 13, № 3 8 tastability is observed. In this paper we report the results of an investigation of the electrical properties of Y2O3-stabilized ZrO2 in the pressure range between 15 and 50 GPa and tem- perature range between 77 and 400 K. 2. Experiment The dc conductivity measurements were carried out in a diamond anvil cell (DAC) with anvils of the «rounded cone-plane» (VerechaginYakovlev) type made of synthetic carbonado-type diamonds [3], consisting of dielectric grains of synthetic diamonds in layers of conducting materials. These anvils are good con- ductors, permitting measurement of the resistance of samples placed between the anvils in the DAC by using the anvils as the electrical contacts to the sample. The resistance of the anvils in a dc setup does not exceed 10 Ohms and has a negligible temperature dependence. Each anvil has two wires attached, but the sample is only in contact with the anvils. Therefore we do not perform strictly four-point meas- urements and the contact resistance is not eliminated. Before the resistance meas- urements the voltage-current characteristic of the system is determined and the resistance measurements are then done in the linear region at a dc voltage below 10 mV. This is important because a larger voltage can lead to a breakdown of the sample due to the fact that it is very thin. The determination of the pressure in the DAC is not easy, since the applied pressure depends on the elastic properties of the compressed layer and anvils as well as on the anvil geometry. The procedure for the determination of the pressure reached in a DAC of the «rounded cone-plane» type has been described in [4,5]. Measurements were made on a compacted powder sample of «partially stabi- lized» tetragonal ZrO2 containing 5 mol % Y2O3. The sample was synthesized by the Daiichi Kigensou Company (Japan, lot # NEY-5M LO524). 3. Experimental results and discussion In Fig. 1 the pressure dependence of the resistance of ZrO2 is displayed. At a pressure of about 35 GPa the resistance of the sample decreases by 34 orders of magnitude. Based on the fact that this result could be reproduced using different samples and different DACs, we are sure that this effect is not caused by a shorten- ing of the anvils nor by a dielectric breakdown of the sample with increasing pres- sure. In Fig. 2 the temperature dependence of the resistance at constant pressure is shown. It can be seen that the temperature dependence of the resistance has re- gions characterized by different slopes when displayed in a log1/T plot. They cor- respond to activation processes described by        kT E RR aexp0 (1) with Ea, the activation energy and R0, a parameter which depends on the mobility and concentration of the charge carriers. The curves change with increasing pressure. At tem- peratures above ~ 320 K the resistance increases again with increasing temperature. Физика и техника высоких давлений 2003, том 13, № 3 9 Fig. 1. Resistance of ZrO2 in the pressure range between 25–48 GPa at ambient tempera- ture. The errors are estimated by averaging results obtained on different samples. The arrow indicates the pressure at which anomalies of the parameters R0 and Ea (see the text and Figs. 3 and 4) are found Fig. 2. Isobaric temperature dependence of the resistance of ZrO2. The arrows mark the temperature where the resistance starts to increase again with increasing temperature. (Insert  resistance at 40 and 42 GPa at temperatures close to ambient) In Fig. 3 the pressure dependence of Ea and R0 are shown. It is well known that R0 is connected with the concentration and mobility of the charge carriers. A de- creasing value of R0 is usually accompanied by an increase of the mobility and of the concentration of the charge carriers. One can see in Fig. 2, that Ea and R0 have anomalies near 42 GPa. At the same pressure the features in behavior of resistance and TEMF are found (Fig. 4). The large drop in the sample resistance may be associated with the ortho- Iortho-II phase transformation. Although the equilibrium phase boundary in pure Физика и техника высоких давлений 2003, том 13, № 3 10 Fig. 3. Pressure dependence of parameters Ea and R0, in Eq. 1. Right arrows on curves in- dicate curves to correspond to R0, left arrows indicate curves to correspond to Ea Fig. 4. Resistance and TEMF of ZrO2 in the pressure range between 40–48 GPa at ambient temperature ZrO2 occurs at much lower pressures (~ 12 GPa), this transition is extremely slug- gish at room temperature and is reported to appear above 30 GPa under room tem- perature compression [6]. Our results provide a first hint that the structural phase transition may be con- nected with changes in the electronic spectrum, but further work is necessary to corroborate this claim and to determine the nature of the electronic changes. Acknowledgments The research was made possible in part by grants RBRF No. 01-03-96494 and CRDF No. REC-005. 1. O. Ohtaka, H. Fukui, T. Kunisada, T. Fujisava, T. Funakashi, W. Utsumi, T. Irifune, K. Kuroda, T. Kikegawa, Phys. Rev. B63, 174108 (2001). 2. J.M. Leger, P.E. Tomaszewski, A. Atouf, A.S. Pereira, Phys. Rev. B47, 14075 (1993). 3. E.N. Yakovlev, B.W. Vinogradov, G.N. Stepanov, Yu. Timofeev, Rev. Phys. Chem. Japan 50, 243 (1980). 4. A.N. Babushkin, High Pressure Research 6, 349 (1992). 5. A.N. Babushkin, Y.A. Kandrina, O.L. Kobeleva, S.N. Schkerin, Y.Y. Volkova, in: Frontiers of High Pressure Research II: Application of High Pressure to Low-Dimensional Novel Electronic Materials, H.D. Hochheimer, B. Kuchta, P.K. Dorhout, J.L. Yarger (eds.), Kluwer Acad. Publ., DordrechtNew YorkLondon (2001), p. 131. 6. S. Desgreniers, K. Lagarec, Phys. Rev. B59, 8467 (1999). HIGH-PRESSURE DC RESISTANCE OF ZrO2
id nasplib_isofts_kiev_ua-123456789-168002
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 0868-5924
language English
last_indexed 2025-12-07T18:51:00Z
publishDate 2003
publisher Донецький фізико-технічний інститут ім. О.О. Галкіна НАН України
record_format dspace
spelling Babushkin, A.N.
Hochheimer, H.D.
Korionov, I.V.
Volkova, Y.Y.
Wolf, G.H.
2020-04-18T19:21:51Z
2020-04-18T19:21:51Z
2003
High-pressure DC resistance of ZrO₂ / A.N. Babushkin, H.D. Hochheimer, I.V. Korionov, Y.Y. Volkova, G.H. Wolf // Физика и техника высоких давлений. — 2003. — Т. 13, № 3. — С. 7-10. — Бібліогр.: 6 назв. — англ.
0868-5924
PACS: 71.30.+h, 71.55.Ht, 72.20.-i
https://nasplib.isofts.kiev.ua/handle/123456789/168002
The resistance and thermoelectromotive force (TEMF) of Y₂O₃-stabilized ZrO₂ have been investigated in the pressure and temperature range between 15 and 50 GPa, and 77 and 400 K, respectively. At a pressure of about 35 GPa the resistance of the sample decreases by 3-4 orders of magnitude. At a pressure of about 42 GPa the anomalies in the pressure dependence of the resistance, TEMF and of the parameters which depend on the concentration, mobility, and activation energy of the charge carriers were found.
The research was made possible in part by grants RBRF No. 01-03-96494 and CRDF No. REC-005.
en
Донецький фізико-технічний інститут ім. О.О. Галкіна НАН України
Физика и техника высоких давлений
High-pressure DC resistance of ZrO₂
Article
published earlier
spellingShingle High-pressure DC resistance of ZrO₂
Babushkin, A.N.
Hochheimer, H.D.
Korionov, I.V.
Volkova, Y.Y.
Wolf, G.H.
title High-pressure DC resistance of ZrO₂
title_full High-pressure DC resistance of ZrO₂
title_fullStr High-pressure DC resistance of ZrO₂
title_full_unstemmed High-pressure DC resistance of ZrO₂
title_short High-pressure DC resistance of ZrO₂
title_sort high-pressure dc resistance of zro₂
url https://nasplib.isofts.kiev.ua/handle/123456789/168002
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