Size-effect of Kondo scattering in point contacts (revisited)
The size-effect of Kondo-scattering in nanometer-sized metallic point contacts is measured with the simplified, mechanically-controlled break-junction technique for CuMn alloy of different Mn concentrations: 0.017; 0.035; and 0.18 (± 0.017) at.%. The results are compared with our previous publicatio...
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| Veröffentlicht in: | Физика низких температур |
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| Datum: | 1998 |
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | English |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
1998
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/175545 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Size-effect of Kondo scattering in point contacts (revisited) / I.K. Yanson, V.V. Fisun, N.L. Bobrov, J.A. Mydosh, J.M. van Ruitenbeek // Физика низких температур. — 1998. — Т. 24, № 7. — С. 654-660. — Бібліогр.: 27 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| Zusammenfassung: | The size-effect of Kondo-scattering in nanometer-sized metallic point contacts is measured with the simplified, mechanically-controlled break-junction technique for CuMn alloy of different Mn concentrations: 0.017; 0.035; and 0.18 (± 0.017) at.%. The results are compared with our previous publication on nominally 0.1 at.% CuMn alloy [1,2]. The increase of width of the Kondo resonance and enhanced ratio of Kondo-peak intensity to electron-phonon scattering intensity is observed for contacts with sizes smaller than 10 nm. From the comparison of electron-phonon scattering intensity for the pressure-type contacts, which correspond to the clean orifice model, we conclude that the size effect is observed in clean contacts with the shape of a channel (nanowire).
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| ISSN: | 0132-6414 |