Mapping of 2D contact perturbations by electrons on a helium film

• Published in: Физика низких температур
• Date: 1998
• Main Authors: Teske, E., Wyder, P., Leiderer, P., Shikin, V.
• Format: Article
• Language: English
• Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 1998
• Subjects: Специальный выпуск International Workshop on Low Temperature Microgravity Physics
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/176402
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Mapping of 2D contact perturbations by electrons on a helium film / E. Teske, P. Wyder, P. Leiderer, V. Shikin // Физика низких температур. — 1998. — Т. 24, № 2. — С. 163-165. — Бібліогр.: 9 назв. — англ.

A promising way to investigate 2D contact phenomena is proposed. This method is based on the idea ot depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid sample containing a 2D charge carrier system. The density of SSE adjusts to screen contact-induced perturbations ot the electrostatic potential across the sample. As a result, the helium layer thickness varies due to the variation of the electrostatic pressure thus providing a map This map may be read off interferometrically by a technique already employed tor the investigation ot multi-electron dimples on helium. We have realized this mapping for a structured electrode as a test sample to demonstrate the resolution of the method.