Mapping of 2D contact perturbations by electrons on a helium film
A promising way to investigate 2D contact phenomena is proposed. This method is based on the idea ot depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid sample containing a 2D charge carrier system. The density of SSE adjusts to screen contact-...
Збережено в:
| Опубліковано в: : | Физика низких температур |
|---|---|
| Дата: | 1998 |
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
1998
|
| Теми: | |
| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/176402 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Mapping of 2D contact perturbations by electrons on a helium film / E. Teske, P. Wyder, P. Leiderer, V. Shikin // Физика низких температур. — 1998. — Т. 24, № 2. — С. 163-165. — Бібліогр.: 9 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-176402 |
|---|---|
| record_format |
dspace |
| spelling |
Teske, E. Wyder, P. Leiderer, P. Shikin, V. 2021-02-04T14:47:25Z 2021-02-04T14:47:25Z 1998 Mapping of 2D contact perturbations by electrons on a helium film / E. Teske, P. Wyder, P. Leiderer, V. Shikin // Физика низких температур. — 1998. — Т. 24, № 2. — С. 163-165. — Бібліогр.: 9 назв. — англ. 0132-6414 PACS: 67.40.-w, 67.70.+n https://nasplib.isofts.kiev.ua/handle/123456789/176402 A promising way to investigate 2D contact phenomena is proposed. This method is based on the idea ot depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid sample containing a 2D charge carrier system. The density of SSE adjusts to screen contact-induced perturbations ot the electrostatic potential across the sample. As a result, the helium layer thickness varies due to the variation of the electrostatic pressure thus providing a map This map may be read off interferometrically by a technique already employed tor the investigation ot multi-electron dimples on helium. We have realized this mapping for a structured electrode as a test sample to demonstrate the resolution of the method. This activity is partly supported by INTAS 93-939 and by NASA-PSA NAS 15-10110, project TM-17. en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур Специальный выпуск International Workshop on Low Temperature Microgravity Physics Mapping of 2D contact perturbations by electrons on a helium film Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Mapping of 2D contact perturbations by electrons on a helium film |
| spellingShingle |
Mapping of 2D contact perturbations by electrons on a helium film Teske, E. Wyder, P. Leiderer, P. Shikin, V. Специальный выпуск International Workshop on Low Temperature Microgravity Physics |
| title_short |
Mapping of 2D contact perturbations by electrons on a helium film |
| title_full |
Mapping of 2D contact perturbations by electrons on a helium film |
| title_fullStr |
Mapping of 2D contact perturbations by electrons on a helium film |
| title_full_unstemmed |
Mapping of 2D contact perturbations by electrons on a helium film |
| title_sort |
mapping of 2d contact perturbations by electrons on a helium film |
| author |
Teske, E. Wyder, P. Leiderer, P. Shikin, V. |
| author_facet |
Teske, E. Wyder, P. Leiderer, P. Shikin, V. |
| topic |
Специальный выпуск International Workshop on Low Temperature Microgravity Physics |
| topic_facet |
Специальный выпуск International Workshop on Low Temperature Microgravity Physics |
| publishDate |
1998 |
| language |
English |
| container_title |
Физика низких температур |
| publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| format |
Article |
| description |
A promising way to investigate 2D contact phenomena is proposed. This method is based on the idea
ot depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid
sample containing a 2D charge carrier system. The density of SSE adjusts to screen contact-induced
perturbations ot the electrostatic potential across the sample. As a result, the helium layer thickness
varies due to the variation of the electrostatic pressure thus providing a map This map may be read off
interferometrically by a technique already employed tor the investigation ot multi-electron dimples on
helium. We have realized this mapping for a structured electrode as a test sample to demonstrate the
resolution of the method.
|
| issn |
0132-6414 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/176402 |
| citation_txt |
Mapping of 2D contact perturbations by electrons on a helium film / E. Teske, P. Wyder, P. Leiderer, V. Shikin // Физика низких температур. — 1998. — Т. 24, № 2. — С. 163-165. — Бібліогр.: 9 назв. — англ. |
| work_keys_str_mv |
AT teskee mappingof2dcontactperturbationsbyelectronsonaheliumfilm AT wyderp mappingof2dcontactperturbationsbyelectronsonaheliumfilm AT leidererp mappingof2dcontactperturbationsbyelectronsonaheliumfilm AT shikinv mappingof2dcontactperturbationsbyelectronsonaheliumfilm |
| first_indexed |
2025-12-01T23:18:27Z |
| last_indexed |
2025-12-01T23:18:27Z |
| _version_ |
1850861098676256768 |