Mapping of 2D contact perturbations by electrons on a helium film
A promising way to investigate 2D contact phenomena is proposed. This method is based on the idea
 ot depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid
 sample containing a 2D charge carrier system. The density of SSE adjusts to...
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| Veröffentlicht in: | Физика низких температур |
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| Datum: | 1998 |
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | Englisch |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
1998
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/176402 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Mapping of 2D contact perturbations by electrons on a helium film / E. Teske, P. Wyder, P. Leiderer, V. Shikin // Физика низких температур. — 1998. — Т. 24, № 2. — С. 163-165. — Бібліогр.: 9 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862653491491635200 |
|---|---|
| author | Teske, E. Wyder, P. Leiderer, P. Shikin, V. |
| author_facet | Teske, E. Wyder, P. Leiderer, P. Shikin, V. |
| citation_txt | Mapping of 2D contact perturbations by electrons on a helium film / E. Teske, P. Wyder, P. Leiderer, V. Shikin // Физика низких температур. — 1998. — Т. 24, № 2. — С. 163-165. — Бібліогр.: 9 назв. — англ. |
| collection | DSpace DC |
| container_title | Физика низких температур |
| description | A promising way to investigate 2D contact phenomena is proposed. This method is based on the idea
ot depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid
sample containing a 2D charge carrier system. The density of SSE adjusts to screen contact-induced
perturbations ot the electrostatic potential across the sample. As a result, the helium layer thickness
varies due to the variation of the electrostatic pressure thus providing a map This map may be read off
interferometrically by a technique already employed tor the investigation ot multi-electron dimples on
helium. We have realized this mapping for a structured electrode as a test sample to demonstrate the
resolution of the method.
|
| first_indexed | 2025-12-01T23:18:27Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-176402 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 0132-6414 |
| language | English |
| last_indexed | 2025-12-01T23:18:27Z |
| publishDate | 1998 |
| publisher | Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| record_format | dspace |
| spelling | Teske, E. Wyder, P. Leiderer, P. Shikin, V. 2021-02-04T14:47:25Z 2021-02-04T14:47:25Z 1998 Mapping of 2D contact perturbations by electrons on a helium film / E. Teske, P. Wyder, P. Leiderer, V. Shikin // Физика низких температур. — 1998. — Т. 24, № 2. — С. 163-165. — Бібліогр.: 9 назв. — англ. 0132-6414 PACS: 67.40.-w, 67.70.+n https://nasplib.isofts.kiev.ua/handle/123456789/176402 A promising way to investigate 2D contact phenomena is proposed. This method is based on the idea
 ot depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid
 sample containing a 2D charge carrier system. The density of SSE adjusts to screen contact-induced
 perturbations ot the electrostatic potential across the sample. As a result, the helium layer thickness
 varies due to the variation of the electrostatic pressure thus providing a map This map may be read off
 interferometrically by a technique already employed tor the investigation ot multi-electron dimples on
 helium. We have realized this mapping for a structured electrode as a test sample to demonstrate the
 resolution of the method. This activity is partly supported by INTAS
 93-939 and by NASA-PSA NAS 15-10110, project
 TM-17. en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур Специальный выпуск International Workshop on Low Temperature Microgravity Physics Mapping of 2D contact perturbations by electrons on a helium film Article published earlier |
| spellingShingle | Mapping of 2D contact perturbations by electrons on a helium film Teske, E. Wyder, P. Leiderer, P. Shikin, V. Специальный выпуск International Workshop on Low Temperature Microgravity Physics |
| title | Mapping of 2D contact perturbations by electrons on a helium film |
| title_full | Mapping of 2D contact perturbations by electrons on a helium film |
| title_fullStr | Mapping of 2D contact perturbations by electrons on a helium film |
| title_full_unstemmed | Mapping of 2D contact perturbations by electrons on a helium film |
| title_short | Mapping of 2D contact perturbations by electrons on a helium film |
| title_sort | mapping of 2d contact perturbations by electrons on a helium film |
| topic | Специальный выпуск International Workshop on Low Temperature Microgravity Physics |
| topic_facet | Специальный выпуск International Workshop on Low Temperature Microgravity Physics |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/176402 |
| work_keys_str_mv | AT teskee mappingof2dcontactperturbationsbyelectronsonaheliumfilm AT wyderp mappingof2dcontactperturbationsbyelectronsonaheliumfilm AT leidererp mappingof2dcontactperturbationsbyelectronsonaheliumfilm AT shikinv mappingof2dcontactperturbationsbyelectronsonaheliumfilm |