Karpus, S., Shliahov, I., Liashchov, M., Borisenko, V., Kochetov, S., Tsiats’ko, E., & Shopen, O. (2023). Application features of the electrostatic systems for measuring the secondary electron emission yield. Problems of Atomic Science and Technology.
Chicago-Zitierstil (17. Ausg.)Karpus, S., I. Shliahov, M. Liashchov, V. Borisenko, S. Kochetov, E. Tsiats’ko, und O. Shopen. "Application Features of the Electrostatic Systems for Measuring the Secondary Electron Emission Yield." Problems of Atomic Science and Technology 2023.
MLA-Zitierstil (8. Ausg.)Karpus, S., et al. "Application Features of the Electrostatic Systems for Measuring the Secondary Electron Emission Yield." Problems of Atomic Science and Technology, 2023.
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