New evidence of the hopping nature of the excess tunnel current in heavily doped silicon - diodes at cryogenic temperatures

• Опубліковано в: : Semiconductor Physics Quantum Electronics & Optoelectronics
• Дата: 2017
• Автори: Borblik, V. L., Shwarts, Yu. M., Shwarts, M. M., Aleinikov, A. B.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2017
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/214933
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: New evidence of the hopping nature of the excess tunnel current in heavily doped silicon - diodes at cryogenic temperatures / V. L. Borblik, Yu. M. Shwarts, M. M. Shwarts, A. B. Aleinikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 2. — С. 195-198. — Бібліогр.: 11 назв. — англ.

The new experimental data concerning the effect of a magnetic field on the electric properties of silicon diodes with high doping levels both in the emitter and base (conduction of which at low temperatures is determined by the excess tunnel current) have been analyzed. In addition to previous investigations of the influence of magnetic fields up to 9.4 T on this tunnel current at 4.2 K, now the measurements have been carried out up to 14 T at temperatures lower than the liquid helium temperature. Under these conditions, the transfer to saturation of the diode magnetoresistance was observed, which agrees with the results predicted theoretically for the hopping conduction via impurity centers in high magnetic fields.