The role of the magnetic component of a strong light field in the electrostrictive effect
Electrostriction forces during laser ablation have been studied both theoretically and experimentally. The components of the electrostriction force for an inhomogeneous electromagnetic field near a substrate were proposed to be taken similarly to those in gases within the nonresonant spectral region...
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2018
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| Cite this: | The role of the magnetic component of a strong light field in the electrostrictive effect / L.V. Poperenko, V.V. Prorok, S.G. Rozouvan, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2018. — Т. 21, № 2. — С. 160-166. — Бібліогр.: 18 назв. — англ. |
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| author | Poperenko, L.V. Prorok, V.V. Rozouvan, S.G. Shaykevich, I.A. |
| author_facet | Poperenko, L.V. Prorok, V.V. Rozouvan, S.G. Shaykevich, I.A. |
| citation_txt | The role of the magnetic component of a strong light field in the electrostrictive effect / L.V. Poperenko, V.V. Prorok, S.G. Rozouvan, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2018. — Т. 21, № 2. — С. 160-166. — Бібліогр.: 18 назв. — англ. |
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| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | Electrostriction forces during laser ablation have been studied both theoretically and experimentally. The components of the electrostriction force for an inhomogeneous electromagnetic field near a substrate were proposed to be taken similarly to those in gases within the nonresonant spectral region. Nonzero Lorentz force in a standing light wave was found to be responsible for the different morphology of the nanostructured surface as compared to etching the transient substrate. Our experiments were performed using the femtosecond laser focused on polished glass and Al-coated glass surfaces. The treated surfaces were studied using atomic force microscopy with a spatial resolution of 30 nm. Nanoscale patterning of the etched surface spots was explained in the framework of theoretical modeling. Possible spatial locations of electrostriction force components in the Gauss profile laser beam have also been discussed.
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Semiconductor Physics, Quantum Electronics & Optoelectronics, 2018. V. 21, N 2. P. 160-166.
© 2018, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
160
Optics
The role of magnetic component of a strong light field
in electrostrictive effect
L.V. Poperenko, V.V. Prorok, S.G. Rozouvan, I.A. Shaykevich
Taras Shevchenko National University of Kyiv, 64/13, Volodymyrska st. 01601, Kyiv, Ukraine
E-mail: sgr@univ.kiev.ua
Abstract. Electrostriction forces during laser ablation have been studied both theoretically
and experimentally. The components of electroctrostriction force for inhomogeneous
electromagnetic field near a substrate were proposed to be taken similarly to those in gases
within nonresonant spectral region. Nonzero Lorentz force in standing light wave was
found to be responsible for different morphology of the nanostructured surface as compared
to etching the transient substrate. Our experiments were performed using the femtosecond
laser focused on polished glass and Al-coated glass surfaces. The treated surfaces were
studied using atomic force microscopy with the spatial resolution of 30 nm. Nanoscale
patterning of the etched surface spots was explained in the frames of theoretical modeling.
Possible spatial locations of electrostriction force components in the Gauss profile laser
beam have been also discussed.
Keywords: electrostriction pressure, Lorentz force, femtosecond laser pulses,
nanoparticles.
doi: https://doi.org/10.15407/spqeo21.02.160
PACS 42.50.Ct, 77.65.-j, 79.20.Eb, 81.15.Fg
Manuscript received 29.05.18; revised version received 05.06.18; accepted for publication
27.06.18; published online 03.07.18.
1. Introduction
Laser ablation has become a known technique for
nanostructure fabrication after introduction of
Ti:sapphire femtosecond laser systems [1]. Femtosecond
laser light interacts with a target during 10
–13
…10
–14
s
intervals. During the interval, the intensity of
electromagnetic field is increased drastically in a tiny
volume that consecutively results in temperature and
electrostrictive pressure rising. The mixture of light
induced ultrafast processes can produce a difference in
nanostructures on the target surface or in the target bulk.
Ultrafast pulsed laser deposition on ZnO target created
variety of nanoforms including nanoparticles and
nanorods [2]. Multi-pulse ablation of bulk gold sample
results in production of nanostructures caused by
combinations of nano-, micro-, and macro-structural
surface modifications [3]. Femtosecond laser pulses train
that was applied for ablation enables a broad and
continuous tunability over the material morphologies
ranging from nanoparticle aggregates to epitaxial thin
films [4]. Laser ablation in liquid produces nanoparticles
with variety of shapes from spherical domination to the
tetragonal ones [5]. Ablation of solid surfaces fabricates
nanoparticle aerosols clouds with particles in the few
nanometer size range [6]. Surface etching by a
nanosecond laser results in specific properties of
nanoparticle film such as low melting temperature and
reduced heat losses [7]. Pulsed-laser ablation of active
glass was able to produce nanoparticles exhibiting such
properties as upconversion pumped by near-infrared
wavelengths and emitting visible light [8]. By contrast to
projects dealing with wide variety of produced
nanostructural forms, research groups produce more
narrow aimed studies. A simple model theoretically
describes the processes involved in irradiation of solid
targets by using femtosecond laser pulses and predicts
the optimal target and laser parameters for nanoparticles
synthesis, which was developed and experimentally
checked [9]. Consecutive treatment after laser irradiation
by Ti:sapphire laser delivering 80 fs pulses allowed
predictably changing the properties of TiO2
SPQEO, 2018. V. 21, N 2. P. 160-166.
Poperenko L.V., Prorok V.V., Rozouvan S.G., Shaykevich I.A. The role of magnetic component of a strong light field …
161
nanostructures grown on Si [100] substrates [10]. The
nanoparticles obtained as a result of laser ablation
process showed more complicated structural properties
after consecutive treatment in Se-evaporated atmosphere
[11]. Nanostructural properties of the obtained
nanoparticles have been studied by variety of
experimental techniques including electron microscopy,
atomic force microscopy, etc. The obtained high
resolution images [5] describe nanoparticles both having
no ideal spherical shape and non-uniform in size [12].
The processes resulted in nanostructural patterning
of the irradiated surface are not completely explained.
For example, focused femtosecond pulses should work as
“optical tweezers” [13] keeping the nanoparticles in the
focal point preventing them from removing out there.
However, numerous experiments register large areas
covered by nanoparticles on the samples surfaces aside
from ablated tracks. The basic description of the
interaction femtosecond laser pulse with a solid substrate
includes the electrostriction mechanism that was found to
be responsible for formation of laser-induced periodic
surface structures [14]. On the other hand, the classical
electrostriction relationship was found to be insufficient
for such structure formation description and the authors
introduced Maxwell stress tensor [15] for correct
explanation of their results.
The variety of the works aimed at studying laser
pulse interaction with a substrate at the nanoscale level
with clear practical output requires some unification of
the basic approaches for laser etching description. The
goal of this research is to study features of laser etching
mechanisms from the viewpoint of basic electromagnetic
theory.
2. Theoretical
As it was found earlier [16], electrostriction force
induced by electromagnetic wave has different properties
as compared to constant electric field case. The latter
case results in the well known ratio where electrostriction
pressure depends on the density of electric field energy.
If electric field produces dipoles in gas or liquid, it leads
to changing the shape and position of the dielectric as a
result of electrostriction pressure. The total process is
considered to be static (otherwise, we have a system with
a nonzero magnetic field). In the case of electromagnetic
wave that propagates through a dielectric, the
electromagnetic field can result in dipoles motion. For
example, an inhomogeneous electric field that interacts
with a dipole in gases can produce an additional to the
“classic” case nonzero Coulomb force [16]. The dipole
motion creates additional pressure, and the final ratio for
electrostriction pressure in isotropic media is not a scalar
value any more.
Let us consider an isotropic media with zero
magnetic succeptibility in a monochromatic
electromagnetic field. For a steady case of the
monochromatic field, both magnetic and electric vectors
can be presented as ( ) ( )trEE ω= sin0
r
and
( ) ( )trHH ω= sin0
r
, respectively. The classical electric
dipole with the polarizability α having two charges
separated by a distance l oscillates with the frequency ω:
( ) ( ) ( )tqEtltl ωα=ω= sinsin 00 .
Electrostriction forces in isotropic media are
proportional to 2
0E . In our early work [16], we show
that dipole irradiated by spatialy inhomogenous
monohromatic light wave experiences an additional force
that can be described as:
DEFES
rrr
div= . (1)
Eq. (1) was derived describing the kinetics of a
single dipole, though it can be understood from a general
reasons considering a bulk media. If we take a charge
density in dielectric media at a point, it is equal to
D
r
div . Finding Coulomb force on the charge as the
product of the charge and the electric field, we obtain
Coulomb force per volume ratio similar to Eq. (1). The
additional force of Eq. (1) acts during a short time of
laser pulse duration causing, for example, polarization-
dependent electrostriction induced gratings in isotropic
media [17]. However, historically electrostriction term
was introduced for dielectric media in constant
electrostatic field. The basic ratio for such electrostriction
pressure was derived from the energy conservation law
for steady state systems. In our case it is related with fast
oscillations of electric and magnetic components of
propagating light, and we obtain an additional pressure
due to the field spatial inhomogeneity. We are continuing
to name such pressure as electrostriction, like to that used
in literature, though technically it is caused by
electromagnetic wave and should be described by
respective formulas.
One should carefully apply Eq. (1) for ultrafast
processes of dipole oscillation. For example, if the laser
frequency fits the ground-excited state energy gap for
dielectric, we obtain more steady state electrostriction
pressure because excited molecular levels are populated
and cannot oscillate with the light frequency. Another
problem may be a short laser pulse duration. For
example, for focused femtosecond laser pulses its
duration is order of magnitudes less then characteristic
times for hydrodynamic equations solutions. For
nanosecond pulses, the processes of thermal and mass
diffusion match focal point dimension, if taking into
account the speed of sound, flow velocities, etc. [17]. A
simple criteria, if the system reaches steady state regime,
is follows: the focal point volume dimensions should be
less than the product of laser pulse duration and the speed
of sound in this media. According to Eq. (1), laser pulse
produces gradient of electromagnetic fields, which result
in dipoles flow. After a few tens nanosecond time, the
steady state regime is established, and the pressure in the
media satisfies the Bernoulli equation. For example, if
moving dipoles localized in the focal point cause
dynamic pressure, it results in lowering the static
pressure in this point.
SPQEO, 2018. V. 21, N 2. P. 160-166.
Poperenko L.V., Prorok V.V., Rozouvan S.G., Shaykevich I.A. The role of magnetic component of a strong light field …
162
The total force applied to the dipole by
electromagnetic field is a sum of Coulomb and Lorentz
forces. In the latter case, we take into account only the
electron speed, neglecting the Lorentz force that acts on
positive ion because of its relatively low velocity (due to
drastical difference between electron and ion masses).
( ) ( )[ ]
( ) ( )[ ]
,0
,cossin
cossin
=
ωω×αω=
=ωω×=
Lorentz
Lorentz
F
ttrBrE
ttrBrVqF
r
rrrr
rrrrr
(2)
where angular brackets describe the time-averaging
procedure. For standing wave with the extra phase shift
2π between magnetic and electric vectors, Eq. (2)
transforms to
( ) ( )[ ]
( ) ( )[ ]( )
( ) ( )[ ].
2
,cos
coscos
2
rBrEF
trBrE
ttrBrVqF
Lorentz
Lorentz
rrrrr
rrrr
rrrrr
×ωα=
ω×ωα=
=ωω×=
(3)
If a laser beam is propagating along the normal to a
conducting planar surface and is reflected from it, we
obtain a standing electromagnetic wave. With account of
Eqs. (2) and (3), the pressure induced by electromagnetic
field on the oscillating dipoles near the surface with a
high reflectivity differs as compared to the case of a
relatively low reflecting surface (e.g., a dielectric
substrate). The non-zero Lorentz force in a standing
electromagnetic wave may result in a quite complicated
trajectory of charged particles [18]. But for our case, the
peculiarities of the dipoles trajectories in focal point do
not define specifics of the pressure induced by
electromagnetic wave. The key issue is that dipoles has
an extra speed, which results in an extra dynamic
pressure.
For the Gaussian profile beam
( )( )222exp ayxE +− propagating along Z axis in the
focal point (weak dependence on Z coordinate),
distribution of forces described by Eqs. (1) and (3) is as
follows:
( ) ( ) ( )
( ) ( ) ( )[ ] ( )
.
2
exp
2
,
,
2
exp,
2
22
2
22
22
+−
×ωα=
+
+−
−=
−
a
yx
rBrEyxF
yx
a
yx
aEyxF
Lorentz
ES
rrrr
(4)
Taking derivatives from Eq. (4), we can find
locations of maximal force values. Coulomb force
maximal values are located near the points
4222
ayx =+ , and maximal values of Lorentz force –
at point x = 0, y = 0. The forces arise in the focal point
for very short time frames, if we apply femtosecond laser
pulses. As a result, different types of waves are formed in
the focal point [16, 17], which satisfy Bernoulli’s
principle for liquids and gases, when the system reaches
the steady state regime. The forces result in dipoles
flows, in higher dynamic pressure associated with the
flows and, as a result, in a lower static pressure according
to the Bernulli principle.
From a pure practical point of view, standing and
travelling waves of high intensity with significant
electrostriction pressure can be obtained by focusing the
laser light on an Al-covered glass plate and the polished
glass one.
3. Experimental and discussion
Specific features of laser light (huge coherence length,
narrow spectral lasing line width and small beam
divergence) allow applying it in variety of laser
microscopy schemes. Focusing the light in a small
Fig. 1. Optical scheme of laser microscope. 1 – stage with 2
step motors for precise XY positioning, 2 – objective lenses, 3 –
dichroic mirror for laser beam coupling with microscope. 4 –
notch filter, 5 – beam condensor for matching laser beam waist
and objective lenses focal point, 6 – femtosecond laser source
with pulse peaker, 7 – PC with an interface for stage 1.
SPQEO, 2018. V. 21, N 2. P. 160-166.
Poperenko L.V., Prorok V.V., Rozouvan S.G., Shaykevich I.A. The role of magnetic component of a strong light field …
163
Fig. 2. Microfotographies of two etched rectangular raster
structures produced on Al covered glass plate. The upper
picture (a) is taken in the reflected light. The distance between
fringes is close to 12.5 µm. The lower picture (b) is taken in the
transient light. The distance between fringes – 2.5 µm. The
upper more bright area of the raster was etched with the laser
power twice higher as compared to the lower more dark area.
volume of studied sample, one can register two-photon
transitions, Raman scattering or other nonlinear
phenomena. Nanostructures (nanoparticles) can be
fabricated using a laser coupled with a scanning optical
microscope because of extremely high electric field
confined in the focal point.
The scheme of our set-up is presented in Fig. 1.
Femtosecond tunable light pulses were generated as 120-
fs pulses within the 800-nm wavelength range by using a
mode-locked Ti:sapphire laser (Mira 900F, Coherent,
Santa Clara, Calif.) followed by a pulse peaker to
decrease lasing pulses repetition rates down to 100 kHz
(Fig. 1). Applying neutral filters with different optical
density, we were able to achieve a required level of
Fig. 3. Atomic force microscopy scan of etched raster structure
on a plane glass substrate.
sample surface treatment (e.g., to reach the ablation
threshold). The threshold of sample destruction was
determined semiquantitatively by removing step-by-step
neutral filters from the laser beam. The threshold energy
was found to be dependent not only on the objective lens
optical strength and vendor but also on everyday laser
cavity alignment. The microscope had a coupled to a
computer motorized XY stage mounted on the optical
table and allowed us to perform different scenarios of
nanostructures fabrication on a sample surface. In orderto
fabricate the nanoparticles structure on a surface, we
performed laser ablation on both polished glass and Al
coated polished glass samples.
Two types of samples were chosen in order to
achieve travelling and standing wave cases during laser
ablation. A microphotography of the fabricated raster
structure of rectangular shape on Al coated glass plate is
presented in Fig. 2. The interline distance was equal to
12.5 µm. Actually, the parallel lines of the raster connect
dots, where the surface was exposed to the laser light
during 0.1 s. The distance between the dots was equal to
12.5 µm, too. The space between dots in the raster lines
was irradiated using the focused laser beam during table
movements when irradiating the sequence of the dots.
Microscope INTEGRA NT-MDT allowed
conducting measurements in the atomic force microscopy
(AFM) regime and was used to study precise surface
topology. AFM spatial resolution reached up to 30 nm.
An example of an etched surface of a polished glass
studied by AFM is presented in Fig. 3. We can see on the
surface both a raster line and a spot where the surface
was exposed for the laser light for longer time (0.1 s).
The width of the line is approximately 2 µm, which is
close to the difraction limit of the objective lens in the
SPQEO, 2018. V. 21, N 2. P. 160-166.
Poperenko L.V., Prorok V.V., Rozouvan S.G., Shaykevich I.A. The role of magnetic component of a strong light field …
164
Fig. 4. AFM scan of etched raster structure on Al covered glass
substrate. Microphotography of the structure is presented in
Fig. 2 (right picture).
focal point. The surface of the sample is completely
covered by submicron size nanoparticles with variety of
sizes (the particles with large diameters are closer to the
track). The particles are forming craterlike rims alongside
the line and dot. The diameter of the rim can be
determined using Eq. (4) ( 4222
ayx =+ ). It is clear that
the particles are congealed droplets of the melted
substance of the sample, which were removed aside the
focal point volume during ablation. The surfaces of
particles are structured, which seems to indicate some
kinetic process adherence of tiny melted droplets into
larger ones. The droplets were turned off the melted spot
on the substrate surface and their spatial distribution on
the surface reflects distribution of the pressure in air,
which influence the droplets movement in the time
periods exceeding 120 femtosecond laser pulse duration
and their final deposition on the substrate suface. The
nanoparticles which are congealed droplets of melted
substrate are scattered around the etched surface spot at
the distances up to 1 cm.
Another AFM scan of an Al-coated glass surface is
presented in Fig. 4. The distance between raster lined
(and the dots which form the lines) close to 2.5 µm. We
can see that surface has two distinctly different
morphology. One part forms a rectangular convex dot
grid and another is hollow lines raster. The surface in the
area around the point marked in the figure as A was
ablated with an additional neutral optical filter with
optical transmittion 50% in the laser beam as compared
to the area of the sample in the vicinity of point B. The
microphotography of etched structure in the transient
light (Fig. 2, right figure) shows drastic difference in the
optical transmittion coefficient between two areas. The
Fig. 5. AFM scan with hihger resolution part of the surface
from Fig. 4.
transmittion coefficient of the bright sample area
measured using a microphotometer reached 25%, which
is a proof of an efficient travelling electromagnetic wave.
Of course, we measued the integrated value of optical
transmittance averaged in convex and hollow grid lines
areas, so the femtosecond light transmittance during the
laser ablation was even higher.
AFM scans of Fig. 4 rasters with higher resolution
are presented in Fig. 5. As we can see the area aside point
B (right figure) is covered by submicron-size
nanoparticles similarly to Fig. 3 case. The spot around A
is covered in contrary to A case by bulk micron-size
particles which form 2.5 µm periodic rectangular grating.
The cross-section of surface profile between the points A
and B (Fig. 4) is shown in Fig. 6. The point A
corresponds to cross-section zero coordinate and the
SPQEO, 2018. V. 21, N 2. P. 160-166.
Poperenko L.V., Prorok V.V., Rozouvan S.G., Shaykevich I.A. The role of magnetic component of a strong light field …
165
0 10 20 30
100
150
200
250
Z
,
n
m
Crosss section coordinate, µm
Fig. 6. Height profile for Fig. 4 (the data is taken along
the line which connects A and B points)
Fig. 7. Electrostriction forces at focused Gauss beam at glass
plate covered with an Al layer (marked in black colour). Grey
areas depict volumes of maximal electrostriction force.
point B – 27 µm. As we can see, the average Z coordinate
on the right side of the plot ([13, 27] cross-section
coordinate interval) is appoximately 40 nm lower as
compared to the left side ([0, 13] cross-section coordinate
interval). The substance of the sample surface was melted
and removed from the focal point in B area to long
distances. We registered spherical nanoparticles on the
substrate scattered to 1 cm far from the etched area of the
sample. We can see variety of spherical submicron-size
nanoparticles that cover AFM scanned area (Fig. 5b). By
the contrast, the melted substance stuck together forming
sole micron-size particles orderly deposited on the
surface around the point A. The scenario with a standing
light wave was achieved by decreasing slightly the laser
power below the Al coating penetration threshold,
allowing the coating to reflect radiation. The process is
shematically depicted in Fig. 7. The surface of the
samples was etched with realization of the standing wave
(left side of Fig. 4) and travelling wave (right side of
Fig. 4). In the latter case, the Al coating was melted off
the surface in the vicinity of the focal point and
transferred aside to the volumes of lower pressure values.
This is a reason for nanoparticles to be scattered around –
volumes of high temperature (electromagnetic wave high
density) and low pressure are different, and we have no
“optical tweezers” in this case.
4. Conclusions
Analyzing the presented results, we can emphasize few
key moments. We consider electrostriction as a property
of dielectric media that causes them to change their shape
under application of a strong electromagnetic field and
creates, as a result, an additional pressure. The
electrostriction force induced by short laser pulses in
isotropic media should be treated with account of
Coulomb and Lorentz forces applied to fast oscillating
dipoles. The classical ratio for the electrostriction
pressure is applicable for relatively steady state regimes
with the corresponding laser pulse duration and times of
sound waves travelling across the focal point volume.
We have two distinctly different cases of
electrostriction pressure for travelling and standing light
waves. The latter case of electrostriction has an
additional component of the pressure – Lorentz force
applied to oscillating dipoles. For Gaussian profile
shaped beams, the volumes of maximal electrostriction
pressure (for maximum electromagnetic field density) are
different, if the wave is travelling, and are the same, if
the electromagnetic wave is standing. It is revealed as
different surface morphology during femtosecond laser
etching planar surfaces. We can obtain either
nanopatterning as a result of removing melted substrate
substance from the focal point or opposite picture –
“optical tweezers”, when the melted substrate parts are
kept together in the focal point.
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Authors and CV
Igor Shaykevich, born in 1934,
defended his Doctoral Dissertation in
Physics and Mathematics in 1988 and
became full professor in 1989.
Professor emeritus at Department of
Optics of Taras Shevchenko National
University of Kyiv. Authored over
300 publications, 15 patents, 2
textbooks. The area of his scientific interests includes
spectral ellipsometry of metals and thin films.
Taras Shevchenko National University of Kyiv, Ukraine
Leonid Poperenko, born in 1950,
defended his Doctoral Dissertation in
Physics and Mathematics in 1992 and
became full professor in 1996. Head
of Department of Optics of Taras
Shevchenko National University of
Kyiv. Authored over 200
publications, 15 patents, 7 textbooks.
The area of his scientific interests includes spectral
ellipsometry of metals and surface science.
Taras Shevchenko National University of Kyiv, Ukraine
Stanislav Rozouvan, born in 1961,
defended his Ph.D. thesis in optics
and laser physics in 1995. Scientist at
Department of Optics of Taras
Shevchenko National University of
Kyiv. Authored over 70 publications,
3 patents. The area of his scientific
interests includes scanning tunneling
microscopy and third-order nonlinear optics.
Taras Shevchenko National University of Kyiv, Ukraine
E-mail: sgr@univ.kiev.ua
Vasyl V. Prorok, born in 1952,
defended his Doctoral Dissertation in
Physics and Mathematics in 1982 and
became senior researcher in 1986.
Senior researcher at Physical
Department of Taras Shevchenko
University of Kyiv. Authored over
100 publications, 7 patents. The area
of his scientific interests includes methods of deposition
of thin films, investigation of optical properties of thin
films, calculation of optical multilayers, radioecology.
Taras Shevchenko National University of Kyiv, Ukraine
|
| id | nasplib_isofts_kiev_ua-123456789-215201 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2026-03-21T14:47:16Z |
| publishDate | 2018 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Poperenko, L.V. Prorok, V.V. Rozouvan, S.G. Shaykevich, I.A. 2026-03-10T12:39:39Z 2018 The role of the magnetic component of a strong light field in the electrostrictive effect / L.V. Poperenko, V.V. Prorok, S.G. Rozouvan, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2018. — Т. 21, № 2. — С. 160-166. — Бібліогр.: 18 назв. — англ. 1560-8034 PACS: 42.50.Ct, 77.65.-j, 79.20.Eb, 81.15.Fg https://nasplib.isofts.kiev.ua/handle/123456789/215201 https://doi.org/10.15407/spqeo21.02.160 Electrostriction forces during laser ablation have been studied both theoretically and experimentally. The components of the electrostriction force for an inhomogeneous electromagnetic field near a substrate were proposed to be taken similarly to those in gases within the nonresonant spectral region. Nonzero Lorentz force in a standing light wave was found to be responsible for the different morphology of the nanostructured surface as compared to etching the transient substrate. Our experiments were performed using the femtosecond laser focused on polished glass and Al-coated glass surfaces. The treated surfaces were studied using atomic force microscopy with a spatial resolution of 30 nm. Nanoscale patterning of the etched surface spots was explained in the framework of theoretical modeling. Possible spatial locations of electrostriction force components in the Gauss profile laser beam have also been discussed. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Optics The role of the magnetic component of a strong light field in the electrostrictive effect Article published earlier |
| spellingShingle | The role of the magnetic component of a strong light field in the electrostrictive effect Poperenko, L.V. Prorok, V.V. Rozouvan, S.G. Shaykevich, I.A. Optics |
| title | The role of the magnetic component of a strong light field in the electrostrictive effect |
| title_full | The role of the magnetic component of a strong light field in the electrostrictive effect |
| title_fullStr | The role of the magnetic component of a strong light field in the electrostrictive effect |
| title_full_unstemmed | The role of the magnetic component of a strong light field in the electrostrictive effect |
| title_short | The role of the magnetic component of a strong light field in the electrostrictive effect |
| title_sort | role of the magnetic component of a strong light field in the electrostrictive effect |
| topic | Optics |
| topic_facet | Optics |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/215201 |
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