Lytvyn, P., Malyuta, S., Indutnyi, I., Efremov, A., Slobodyan, O., Min’ko, V., . . . Prokopenko, I. (2018). Features of mechanical scanning probe lithography on graphene oxide and As(Ge)Se chalcogenide resist. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Lytvyn, P.M, S.V Malyuta, I.Z Indutnyi, A.A Efremov, O.V Slobodyan, V.I Min’ko, A.N Nazarov, O.V Borysov, та I.V Prokopenko. "Features of Mechanical Scanning Probe Lithography on Graphene Oxide and As(Ge)Se Chalcogenide Resist." Semiconductor Physics Quantum Electronics & Optoelectronics 2018.
Стиль цитування MLA (8-ме видання)Lytvyn, P.M, et al. "Features of Mechanical Scanning Probe Lithography on Graphene Oxide and As(Ge)Se Chalcogenide Resist." Semiconductor Physics Quantum Electronics & Optoelectronics, 2018.